Inventor · disambiguated record

Hsen-Lin Wu

Also filed as: WU HSEN-LIN

1 granted patent·2 citations·filing 2004–2004

19Inventor score

Technology areasG06T

Files withTAIWAN SEMICONDUCTOR MFG CORP1

Top patents by PatentIndex Score

1 record

0143US7469057B2System and method for inspecting errors on a waferTAIWAN SEMICONDUCTOR MFG CORP·Filed 2004·Granted Dec 23, 2008·2 cites·20 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →