Inventor · disambiguated record
Allison Holbrook
Also filed as: HOLBROOK ALLISON · HOLBROOK ALLISON K
21 granted patents·2 pending applications·378 citations·filing 1997–2010
96Inventor score
Top patents by PatentIndex Score
23 records- 0190US6975014B1Method for making an ultra thin FDSOI device with improved short-channel performanceADVANCED MICRO DEVICES INC·Filed 2001·Granted Dec 13, 2005·64 cites·7 claims
- 0284US6872613B1Method for integrating metals having different work functions to form CMOS gates having a high-k gate dielectric and related structureADVANCED MICRO DEVICES INC·Filed 2003·Granted Mar 29, 2005·28 cites·25 claims
- 0382US6709924B1Fabrication of shallow trench isolation structures with rounded corner and self-aligned gateADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 23, 2004·32 cites·21 claims
- 0480US7176531B1CMOS gates formed by integrating metals having different work functions and having a high-k gate dielectricADVANCED MICRO DEVICES INC·Filed 2004·Granted Feb 13, 2007·22 cites·6 claims
- 0580US6605843B1Fully depleted SOI device with tungsten damascene contacts and method of forming sameADVANCED MICRO DEVICES INC·Filed 2000·Granted Aug 12, 2003·31 cites·16 claims
- 0678US6448163B1Method for fabricating T-shaped transistor gateADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 10, 2002·25 cites·25 claims
- 0776US6060328AMethods and arrangements for determining an endpoint for an in-situ local interconnect etching processADVANCED MICRO DEVICES INC·Filed 1997·Granted May 9, 2000·40 cites·20 claims
- 0874US7498222B1Enhanced etching of a high dielectric constant layerADVANCED MICRO DEVICES INC·Filed 2006·Granted Mar 3, 2009·6 cites·15 claims
- 0974US5920796AIn-situ etch of BARC layer during formation of local interconnectsADVANCED MICRO DEVICES INC·Filed 1997·Granted Jul 6, 1999·45 cites·25 claims
- 1072US6821713B1Method for lateral trimming of spacersADVANCED MICRO DEVICES INC·Filed 2002·Granted Nov 23, 2004·15 cites·29 claims
- 1171US7675104B2Integrated circuit memory system employing silicon rich layersSPANSION LLC·Filed 2006·Granted Mar 9, 2010·3 cites·10 claims
- 1271US6358362B1Methods and arrangements for determining an endpoint for an in-situ local interconnect etching processADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 19, 2002·12 cites·8 claims
- 1370US7465644B1Isolation region bird's beak suppressionADVANCED MICRO DEVICES INC·Filed 2005·Granted Dec 16, 2008·5 cites·24 claims
- 1470US6495853B1Self-aligned gate semiconductorADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 17, 2002·16 cites·10 claims
- 1559US7803680B2Self-aligned patterning method by using non-conformal film and etch back for flash memory and other semiconductor applicationsSPANSION LLC·Filed 2007·Granted Sep 28, 2010·1 cites·15 claims
- 1657US6358760B1Method for amorphous silicon local interconnect etchADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 19, 2002·6 cites·18 claims
- 1756US6472326B1Reliable particle removal following a process chamber wet cleanADVANCED MICRO DEVICES INC·Filed 2000·Granted Oct 29, 2002·7 cites·17 claims
- 1851US7943980B2Self-aligned patterning method by using non-conformal film and etch back for flash memory and other semiconductur applicationsSPANSION LLC·Filed 2010·Granted May 17, 2011·0 cites·5 claims
- 1950US7906395B2Self-aligned patterning method by using non-conformal film and etch back for flash memory and other semiconductor applicationsSPANSION LLC·Filed 2010·Granted Mar 15, 2011·0 cites·15 claims
- 2042US6383945B1High selectivity pad etch for thick topside stacksADVANCED MICRO DEVICES INC·Filed 1999·Granted May 7, 2002·9 cites·4 claims
- 2142US2008096357A1Method for manufacturing a memory deviceADVANCED MICRO DEVICES INC·Filed 2006·Application pending·0 cites
- 2241US6013156ABubble monitor for semiconductor manufacturingADVANCED MICRO DEVICES INC·Filed 1998·Granted Jan 11, 2000·11 cites·20 claims
- 2336US2005101147A1Method for integrating a high-k gate dielectric in a transistor fabrication processADVANCED MICRO DEVICES INC·Filed 2003·Application pending·0 cites
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