Inventor · disambiguated record
Grigory Klebanov
Also filed as: KLEBANOV GRIGORY
5 granted patents·1 citations·filing 2019–2022
60Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD5
Top patents by PatentIndex Score
5 records- 0163US11056404B1Evaluating a hole formed in an intermediate productAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 6, 2021·1 cites·17 claims
- 0252US12347734B2Examination of a hole formed in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Jul 1, 2025·0 cites·21 claims
- 0347US11686571B2Local shape deviation in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Jun 27, 2023·0 cites·20 claims
- 0444US11651509B2Method, system and computer program product for 3D-NAND CDSEM metrologyAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted May 16, 2023·0 cites·11 claims
- 0544US11443420B2Generating a metrology recipe usable for examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Sep 13, 2022·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →