Inventor · disambiguated record
Hideaki Ohkubo
Also filed as: OHKUBO HIDEAKI
12 granted patents·3 pending applications·153 citations·filing 1992–2021
89Inventor score
Files withKELK LTD7KOMATSU MFG CO LTD3NIKON CORP2ASAHI KASEI CONSTR MAT CO LTD1MITSUBISHI ELECTRIC CORP1
Top patents by PatentIndex Score
15 records- 0189US6477844B2Thermoelectric conversion device and method of manufacturing the sameKOMATSU MFG CO LTD·Filed 2001·Granted Nov 12, 2002·60 cites·4 claims
- 0279US11797033B2Temperature control system and temperature control methodKELK LTD·Filed 2019·Granted Oct 24, 2023·2 cites·15 claims
- 0373US5508517AScanning probe type microscope apparatusNIKON CORP·Filed 1995·Granted Apr 16, 1996·46 cites·13 claims
- 0468US11935767B2Temperature control deviceKELK LTD·Filed 2019·Granted Mar 19, 2024·1 cites·14 claims
- 0565US6666031B2Fluid temperature control apparatusKOMATSU MFG CO LTD·Filed 2003·Granted Dec 23, 2003·10 cites·9 claims
- 0662US7639107B2Overcurrent relayMITSUBISHI ELECTRIC CORP·Filed 2005·Granted Dec 29, 2009·4 cites·3 claims
- 0759US6374616B2Heat exchangerKOMATSU MFG CO LTD·Filed 2000·Granted Apr 23, 2002·10 cites·6 claims
- 0857US11955353B2Temperature adjustment device and method for manufacturing temperature adjustment deviceKELK LTD·Filed 2019·Granted Apr 9, 2024·0 cites·6 claims
- 0956US5276324AComposite scanning tunneling microscopeNIKON CORP·Filed 1992·Granted Jan 4, 1994·20 cites·9 claims
- 1054US11978621B2Temperature adjustment device with spacersKELK LTD·Filed 2019·Granted May 7, 2024·0 cites·11 claims
- 1152US12131940B2Temperature control deviceKELK LTD·Filed 2019·Granted Oct 29, 2024·0 cites·8 claims
- 1251US2023384808A1Temperature control systemKELK LTD·Filed 2021·Application pending·0 cites
- 1349US2010295201A1Process for producing heat curing resin foamed plateASAHI KASEI CONSTR MAT CO LTD·Filed 2008·Application pending·0 cites
- 1435US11309474B2Thermoelectric moduleKELK LTD·Filed 2018·Granted Apr 19, 2022·0 cites·14 claims
- 1533US2004085702A1Thermal overcurrent relayFiled 2002·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →