Inventor · disambiguated record
David P. Nackashi
Also filed as: NACKASHI DAVID · NACKASHI DAVID P
45 granted patents·10 pending applications·273 citations·filing 2005–2025
98Inventor score
Top patents by PatentIndex Score
55 records- 0196US9324539B2Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devicesPROTOCHIPS INC·Filed 2014·Granted Apr 26, 2016·14 cites·21 claims
- 0296US8829469B2Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devicesDAMIANO JR JOHN·Filed 2011·Granted Sep 9, 2014·24 cites·14 claims
- 0396US7713053B2Reusable template for creation of thin films; method of making and using template; and thin films produced from templatePROTOCHIPS INC·Filed 2005·Granted May 11, 2010·26 cites·36 claims
- 0494US8872129B2Microscopy support structuresDAMIANO JR JOHN·Filed 2008·Granted Oct 28, 2014·19 cites·24 claims
- 0594US8466432B2Sample holder providing interface to semiconductor device with high density connectionsDAMIANO JR JOHN·Filed 2011·Granted Jun 18, 2013·18 cites·15 claims
- 0693US12130858B2Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2023·Granted Oct 29, 2024·1 cites·20 claims
- 0793US11902665B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Feb 13, 2024·4 cites·20 claims
- 0892US8513621B2Specimen holder used for mountingNACKASHI DAVID P·Filed 2009·Granted Aug 20, 2013·24 cites·18 claims
- 0989US10986279B1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2020·Granted Apr 20, 2021·2 cites·12 claims
- 1088US9666409B2Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devicesPROTOCHIPS INC·Filed 2016·Granted May 30, 2017·3 cites·20 claims
- 1188US9048065B2Methods of using temperature control devices in electron microscopyDAMIANO JOHN·Filed 2010·Granted Jun 2, 2015·10 cites·14 claims
- 1287US9275826B2Microscopy support structuresPROTOCHIPS INC·Filed 2014·Granted Mar 1, 2016·5 cites·22 claims
- 1387US8920723B2Sample support structure and methodsDAMIANO JR JOHN·Filed 2007·Granted Dec 30, 2014·11 cites·20 claims
- 1487US2025338020A1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 1586US9312097B2Specimen holder used for mounting samples in electron microscopesPROTOCHIPS INC·Filed 2014·Granted Apr 12, 2016·7 cites·19 claims
- 1686US9275825B2Sample holder for electron microscopy for low-current, low-noise analysisDAMIANO JOHN·Filed 2012·Granted Mar 1, 2016·8 cites·8 claims
- 1785USD841183SWindow E-chip for an electron microscopePROTOCHIPS INC·Filed 2016·Granted Feb 19, 2019·25 cites·1 claims
- 1885US9437393B2Method for forming an electrical connection to an sample support in an electron microscope holderPROTOCHIPS INC·Filed 2013·Granted Sep 6, 2016·11 cites·14 claims
- 1984US12375815B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2024·Granted Jul 29, 2025·0 cites·20 claims
- 2084US12284445B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2024·Granted Apr 22, 2025·0 cites·20 claims
- 2184US9818578B2Device for monitoring environmental states of a microscope sample with an electron microscope sample holderPROTOCHIPS INC·Filed 2015·Granted Nov 14, 2017·3 cites·20 claims
- 2284US9064672B2Specimen mount for microscopyMICK STEPHEN E·Filed 2008·Granted Jun 23, 2015·10 cites·17 claims
- 2384US2025053594A1Systems and methods of metadata and image management for reviewing data from transmission electron microscope (tem) sessionsPROTOCHIPS INC·Filed 2024·Application pending·0 cites
- 2483US9040939B2Membrane supports with reinforcement featuresDAMIANO JR JOHN·Filed 2008·Granted May 26, 2015·11 cites·17 claims
- 2582US8872128B2Sample holder providing interface to semiconductor device with high density connectionsPROTOCHIPS INC·Filed 2013·Granted Oct 28, 2014·4 cites·16 claims
- 2680US8859991B2Specimen holder used for mounting samples in electron microscopesPROTOCHIPS INC·Filed 2013·Granted Oct 14, 2014·5 cites·19 claims
- 2780US8853646B2Specimen holder used for mounting samples in electron microscopesPROTOCHIPS INC·Filed 2013·Granted Oct 7, 2014·5 cites·19 claims
- 2880US2025260901A1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 2977US12010430B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 3076US11755639B2Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2022·Granted Sep 12, 2023·0 cites·20 claims
- 3176US10128079B2MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2016·Granted Nov 13, 2018·1 cites·20 claims
- 3276USD806892STip of a sample holderPROTOCHIPS INC·Filed 2014·Granted Jan 2, 2018·20 cites·1 claims
- 3374US11455333B1Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2022·Granted Sep 27, 2022·0 cites·20 claims
- 3472US11477388B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2021·Granted Oct 18, 2022·0 cites·20 claims
- 3572US11170968B2MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2020·Granted Nov 9, 2021·0 cites·14 claims
- 3672US9837746B2Method for forming an electrical connection to a sample support in an electron microscope holderPROTOCHIPS INC·Filed 2016·Granted Dec 5, 2017·2 cites·20 claims
- 3769US11514586B1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Nov 29, 2022·0 cites·25 claims
- 3869US11399138B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2021·Granted Jul 26, 2022·0 cites·10 claims
- 3968US10777380B2MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2019·Granted Sep 15, 2020·0 cites·20 claims
- 4065US10446363B2MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2018·Granted Oct 15, 2019·0 cites·20 claims
- 4163US2025029810A1Methods and systems for selectively managing image and metadata from transmission electron microscope (tem) sessions at multiple temporal or spatial resolutionsPROTOCHIPS INC·Filed 2024·Application pending·0 cites
- 4262US10256563B2Method for forming an electrical connection to a sample support in an electron microscope holderPROTOCHIPS INC·Filed 2017·Granted Apr 9, 2019·0 cites·17 claims
- 4362US10192714B2Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devicesPROTOCHIPS INC·Filed 2017·Granted Jan 29, 2019·0 cites·14 claims
- 4461US10460906B2Method for monitoring environmental states of a microscope sample with an electron microscope sample holderPROTOCHIPS INC·Filed 2017·Granted Oct 29, 2019·0 cites·10 claims
- 4561US2025323009A1Systems and methods for temperature control in electron microscopyPROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 4660US10043633B2Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devicesPROTOCHIPS INC·Filed 2016·Granted Aug 7, 2018·0 cites·19 claims
- 4759US10503127B2Method for safe control of gas delivery to an electron microscope sample holderPROTOCHIPS INC·Filed 2018·Granted Dec 10, 2019·0 cites·15 claims
- 4859US9984850B2Microscopy support structuresPROTOCHIPS INC·Filed 2016·Granted May 29, 2018·0 cites·18 claims
- 4954US2007297216A1Self-assembly of molecular devicesUNIV RICE WILLIAM M·Filed 2007·Application pending·0 cites
- 5052US9915926B2Method for safe control of gas delivery to an electron microscope sample holderPROTOCHIPS INC·Filed 2015·Granted Mar 13, 2018·0 cites·15 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
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