Inventor · disambiguated record
Parag Birmiwal
Also filed as: BIRMIWAL PARAG
9 granted patents·1 pending application·65 citations·filing 2004–2011
86Inventor score
Top patents by PatentIndex Score
10 records- 0190US7386775B2Scan verification for a scan-chain device under testIBM·Filed 2005·Granted Jun 10, 2008·27 cites·17 claims
- 0288US7408336B2Importation of virtual signals into electronic test equipment to facilitate testing of an electronic componentIBM·Filed 2005·Granted Aug 5, 2008·16 cites·18 claims
- 0376US7512925B2System and method for reducing test time for loading and executing an architecture verification program for a SoCIBM·Filed 2006·Granted Mar 31, 2009·11 cites·20 claims
- 0470US7464354B2Method and apparatus for performing temporal checkingIBM·Filed 2005·Granted Dec 9, 2008·5 cites·6 claims
- 0562US7915884B2Importation of virtual signals into electronic test equipment to facilitate testing of an electronic componentIBM·Filed 2008·Granted Mar 29, 2011·3 cites·17 claims
- 0662US7853420B2Performing temporal checkingIBM·Filed 2008·Granted Dec 14, 2010·3 cites·6 claims
- 0748US7934042B2Voltage indicator signal generation system and methodIBM·Filed 2004·Granted Apr 26, 2011·0 cites·10 claims
- 0846US8095720B2Voltage indicator signal generation system and methodBIRMIWAL PARAG·Filed 2011·Granted Jan 10, 2012·0 cites·8 claims
- 0945US8131906B2Voltage indicator signal generation system and methodBIRMIWAL PARAG·Filed 2010·Granted Mar 6, 2012·0 cites·8 claims
- 1043US2007220338A1Method and system for generating checkpoints of hardware description language simulations that include a specific model state together with a software testcase stateIBM·Filed 2006·Application pending·0 cites
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