Inventor · disambiguated record
Piero Migliorato
Also filed as: MIGLIORATO PIERO
16 granted patents·1 pending application·337 citations·filing 1974–2006
94Inventor score
Files withSEIKO EPSON CORP12GEN ELECTRIC CO PLC2BELL TELEPHONE LABOR INC1MIGLIORATO PIERO1SECR DEFENCE BRIT1
Top patents by PatentIndex Score
17 records- 0193US6657269B2Sensor cellSEIKO EPSON CORP·Filed 2001·Granted Dec 2, 2003·119 cites·49 claims
- 0289US3978510AHeterojunction photovoltaic devices employing i-iii-vi compoundsBELL TELEPHONE LABOR INC·Filed 1974·Granted Aug 31, 1976·40 cites·8 claims
- 0386US7221016B2Semiconductor device with memory function and method of manufactureSEIKO EPSON CORP·Filed 2004·Granted May 22, 2007·35 cites·26 claims
- 0483US6548316B1Monolithic semiconductor device and method of manufacturing the sameSEIKO EPSON CORP·Filed 2000·Granted Apr 15, 2003·31 cites·17 claims
- 0568US6787403B2Semiconductor device and method of manufactureSEIKO EPSON CORP·Filed 2001·Granted Sep 7, 2004·12 cites·8 claims
- 0667US6580129B2Thin-film transistor and its manufacturing methodSEIKO EPSON CORP·Filed 2001·Granted Jun 17, 2003·14 cites·12 claims
- 0763US4880753AMethod of fabricating a polysilicon thin film transistorGEN ELECTRIC CO PLC·Filed 1989·Granted Nov 14, 1989·21 cites·5 claims
- 0860US4834505AMatrix addressable displaysGEN ELECTRIC CO PLC·Filed 1987·Granted May 30, 1989·20 cites·19 claims
- 0957US6765265B2System and method for manufacturing a thin film transistorSEIKO EPSON CORP·Filed 2001·Granted Jul 20, 2004·7 cites·12 claims
- 1057US6714027B1Method and apparatus for calculating the electrical characteristics of materials of thin film transistorsSEIKO EPSON CORP·Filed 2000·Granted Mar 30, 2004·9 cites·2 claims
- 1157US6548356B2Thin film transistorSEIKO EPSON CORP·Filed 2001·Granted Apr 15, 2003·8 cites·20 claims
- 1255US6580633B2Nonvolatile semiconductor memory deviceSEIKO EPSON CORP·Filed 2001·Granted Jun 17, 2003·6 cites·14 claims
- 1350US6621101B2Thin-film transistorSEIKO EPSON CORP·Filed 2001·Granted Sep 16, 2003·4 cites·9 claims
- 1447US6727123B2Method for manufacturing a thin-film transistor comprising a recombination centerSEIKO EPSON CORP·Filed 2001·Granted Apr 27, 2004·1 cites·15 claims
- 1545US2006197118A1Detection of molecular interactions using a field effect transistorMIGLIORATO PIERO·Filed 2006·Application pending·0 cites
- 1644US4494133AInfrared sensitive photo diodeSECR DEFENCE BRIT·Filed 1982·Granted Jan 15, 1985·9 cites·12 claims
- 1740US6528830B1Thin film transistorSEIKO EPSON CORP·Filed 2001·Granted Mar 4, 2003·1 cites·11 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →