Inventor · disambiguated record
Shalini Venkatesh
Also filed as: VENKATESH SHALINI
17 granted patents·4 pending applications·301 citations·filing 1995–2009
94Inventor score
Files withAVAGO TECHNOLOGIES GENERAL IP5HEWLETT PACKARD CO5AGILENT TECHNOLOGIES INC4APTINA IMAGING CORP2FOUQUET JULIE E2
Top patents by PatentIndex Score
21 records- 0193US7976387B2Free-standing input deviceAVAGO TECHNOLOGIES GENERAL IP·Filed 2006·Granted Jul 12, 2011·32 cites·11 claims
- 0284US7450250B2Method and apparatus for determining surface displacement based on an image of a retroreflector attached to the surfaceAVAGO TECHNOLOGIES GENERAL IP·Filed 2005·Granted Nov 11, 2008·10 cites·22 claims
- 0383US7580545B2Method and system for determining gaze direction in a pupil detection systemAVAGO TECHNOLOGIES GENERAL IP·Filed 2005·Granted Aug 25, 2009·21 cites·20 claims
- 0483US6198856B1Optical switch having test portsAGILENT TECHNOLOGIES INC·Filed 1999·Granted Mar 6, 2001·63 cites·14 claims
- 0582US7399954B2System and method for an optical navigation device configured to generate navigation information through an optically transparent layer and to have skating functionalityAVAGO TECHNOLOGIES ECBU IP PTE·Filed 2005·Granted Jul 15, 2008·12 cites·18 claims
- 0677US7106511B2Imaging system with large depth of fieldAGILENT TECHNOLOGIES INC·Filed 2004·Granted Sep 12, 2006·19 cites·21 claims
- 0772US5850287ARoller assembly having pre-aligned for on-line thickness measurementsHEWLETT PACKARD CO·Filed 1997·Granted Dec 15, 1998·35 cites·7 claims
- 0868US7978174B2System and method for interactive three-dimensional position trackingAVAGO TECHNOLOGIES GENERAL IP·Filed 2006·Granted Jul 12, 2011·6 cites·20 claims
- 0966US5610716AMethod and apparatus for measuring film thickness utilizing the slope of the phase of the Fourier transform of an autocorrelator signalHEWLETT PACKARD CO·Filed 1995·Granted Mar 11, 1997·28 cites·9 claims
- 1065US5731876AMethod and apparatus for on-line determination of the thickness of a multilayer film using a partially reflecting roller and low coherence reflectometryHEWLETT PACKARD CO·Filed 1996·Granted Mar 24, 1998·27 cites·14 claims
- 1163US5633712AMethod and apparatus for determining the thickness and index of refraction of a film using low coherence reflectometry and a reference surfacesHEWLETT PACKARD CO·Filed 1995·Granted May 27, 1997·25 cites·10 claims
- 1253US2008096643A1System and method for using image analysis of user interface signals for program controlVENKATESH SHALINI·Filed 2006·Application pending·0 cites
- 1352US6668107B2Method and apparatus for reducing optical insertion loss in planar lightwave circuits through dielectric perturbation optimizationAGILENT TECHNOLOGIES INC·Filed 2001·Granted Dec 23, 2003·3 cites·20 claims
- 1451US6798939B2Bubble stability in an optical switchAGILENT TECHNOLOGIES INC·Filed 2002·Granted Sep 28, 2004·3 cites·33 claims
- 1550US5646734AMethod and apparatus for independently measuring the thickness and index of refraction of films using low coherence reflectometryHEWLETT PACKARD CO·Filed 1995·Granted Jul 8, 1997·15 cites·8 claims
- 1648US7912315B2Method and system for reducing artifacts in image detectionAPTINA IMAGING CORP·Filed 2009·Granted Mar 22, 2011·0 cites·12 claims
- 1747US7812822B2Opto-mechanical pointing devices that track the movement of rollers positioned at the base of the pointing devicesAVAGO TECHNOLOGIES GENERAL IP·Filed 2006·Granted Oct 12, 2010·0 cites·5 claims
- 1845US7593586B2Method and system for reducing artifacts in image detectionAPTINA IMAGING CORP·Filed 2004·Granted Sep 22, 2009·2 cites·12 claims
- 1944US2008061254A1Utilizing reflective substrates and patterned filters for security and authenticationFOUQUET JULIE E·Filed 2006·Application pending·0 cites
- 2039US2007031002A1Method and system for reducing artifacts in image detectionVENKATESH SHALINI·Filed 2005·Application pending·0 cites
- 2137US2008074652A1Retroreflector-based system and method for detecting intrusion into a restricted areaFOUQUET JULIE E·Filed 2006·Application pending·0 cites
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