Inventor · disambiguated record
Noboru Morita
Also filed as: MORITA NOBORU
27 granted patents·2 pending applications·367 citations·filing 1988–2010
96Inventor score
Files withNEC ELECTRONICS CORP16FUJITSU LTD4TOSHIBA KK3AGENCY IND SCIENCE TECHN1AIDA CHEMICAL IND CO LTD1
Top patents by PatentIndex Score
29 records- 0193US5293585AIndustrial expert systemTOSHIBA KK·Filed 1992·Granted Mar 8, 1994·124 cites·11 claims
- 0289US7763979B2Organic insulating film, manufacturing method thereof, semiconductor device using such organic insulating film and manufacturing method thereofNEC ELECTRONICS CORP·Filed 2006·Granted Jul 27, 2010·12 cites·26 claims
- 0387US7420279B2Carbon containing silicon oxide film having high ashing tolerance and adhesionNEC ELECTRONICS CORP·Filed 2006·Granted Sep 2, 2008·13 cites·7 claims
- 0487US7180191B2Semiconductor device and method of manufacturing a semiconductor deviceNEC ELECTRONICS CORP·Filed 2005·Granted Feb 20, 2007·14 cites·20 claims
- 0586US7563705B2Manufacturing method of semiconductor deviceNEC ELECTRONICS CORP·Filed 2006·Granted Jul 21, 2009·10 cites·9 claims
- 0683US7615498B2Method of manufacturing a semiconductor deviceNEC ELECTRONICS CORP·Filed 2007·Granted Nov 10, 2009·10 cites·6 claims
- 0781US5057335AMethod for forming a ceramic coating by laser beam irradiationDIPSOL CHEM·Filed 1989·Granted Oct 15, 1991·36 cites·13 claims
- 0879US7473630B2Semiconductor device and method for manufacturing sameNEC ELECTRONICS CORP·Filed 2006·Granted Jan 6, 2009·7 cites·7 claims
- 0979US7391115B2Semiconductor device and manufacturing method thereofNEC ELECTRONICS CORP·Filed 2004·Granted Jun 24, 2008·23 cites·4 claims
- 1074US7833901B2Method for manufacturing a semiconductor device having a multi-layered insulating structure of SiOCH layers and an SiO2 layerNEC ELECTRONICS CORP·Filed 2006·Granted Nov 16, 2010·5 cites·44 claims
- 1172US7132732B2Semiconductor device having two distinct sioch layersNEC ELECTRONICS CORP·Filed 2004·Granted Nov 7, 2006·16 cites·33 claims
- 1271US7634524B2Arithmetic method and function arithmetic circuit for a fast fourier transformFUJITSU LTD·Filed 2004·Granted Dec 15, 2009·19 cites·16 claims
- 1365US8254472B2Communication device and communication systemMORITA NOBORU·Filed 2010·Granted Aug 28, 2012·3 cites·8 claims
- 1464US7461114B2Fourier transform apparatusFUJITSU LTD·Filed 2003·Granted Dec 2, 2008·12 cites·9 claims
- 1563US7135776B2Semiconductor device and method for manufacturing sameNEC ELECTRONICS CORP·Filed 2005·Granted Nov 14, 2006·2 cites·12 claims
- 1663US7074698B2Method of fabricating semiconductor device using plasma-enhanced CVDNEC ELECTRONICS CORP·Filed 2004·Granted Jul 11, 2006·5 cites·27 claims
- 1761US5139739AGold alloy for black coloring, processed article of black colored gold alloy and method for production of the processed articleAGENCY IND SCIENCE TECHN·Filed 1991·Granted Aug 18, 1992·17 cites·5 claims
- 1860US7910474B2Method of manufacturing a semiconductor deviceNEC CORP·Filed 2008·Granted Mar 22, 2011·1 cites·12 claims
- 1960US7102236B2Carbon containing silicon oxide film having high ashing tolerance and adhesionNEC ELECTRONICS CORP·Filed 2004·Granted Sep 5, 2006·6 cites·11 claims
- 2058US7620676B2Lookup table and data acquisition methodFUJITSU LTD·Filed 2006·Granted Nov 17, 2009·2 cites·11 claims
- 2152US7582970B2Carbon containing silicon oxide film having high ashing tolerance and adhesionNEC ELECTRONICS CORP·Filed 2008·Granted Sep 1, 2009·0 cites·7 claims
- 2252US6938191B2Access control device and testing methodFUJITSU LTD·Filed 2002·Granted Aug 30, 2005·6 cites·22 claims
- 2351US7482263B2Semiconductor device and method for manufacturing the sameNEC ELECTRONICS CORP·Filed 2006·Granted Jan 27, 2009·0 cites·17 claims
- 2448US7045895B2Semiconductor device and method for manufacturing the sameNEC ELECTRONICS CORP·Filed 2004·Granted May 16, 2006·1 cites·16 claims
- 2545US2004152334A1Organic insulating film, manufacturing method thereof, semiconductor device using such organic insulating film and manufacturing method thereofNEC ELECTONICS CORP·Filed 2003·Application pending·0 cites
- 2641US2003155657A1Manufacturing method of semiconductor deviceNEC ELECTRONICS CORP·Filed 2003·Application pending·0 cites
- 2738US5299149ASystem for detecting alternating voltage and/or currentTOSHIBA KK·Filed 1991·Granted Mar 29, 1994·11 cites·5 claims
- 2834US5943544AMethod for manufacture of precious metal productAIDA CHEMICAL IND CO LTD·Filed 1998·Granted Aug 24, 1999·8 cites·7 claims
- 2933US4872123ACommutation compensation device for a DC machineTOSHIBA KK·Filed 1988·Granted Oct 3, 1989·4 cites·16 claims
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