Inventor · disambiguated record
Tzu-Yin Chiu
Also filed as: CHIU TZU-YIN
24 granted patents·4 pending applications·465 citations·filing 1987–2020
95Inventor score
Files withCHIU TZU-YIN7SEMICONDUCTOR MFG INT SHANGHAI5AT & T BELL LAB3SEMICONDUCTOR MFG INT SHANGHAI CORP3AMERICAN TELEPHONE & TELEGRAPH2
Top patents by PatentIndex Score
28 records- 0194US5856003AMethod for forming pseudo buried layer for sub-micron bipolar or BiCMOS deviceTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Jan 5, 1999·200 cites·15 claims
- 0293US5559360AInductor for high frequency circuitsLUCENT TECHNOLOGIES INC·Filed 1994·Granted Sep 24, 1996·86 cites·14 claims
- 0374US4784971AProcess for manufacturing semiconductor BICMOS deviceAMERICAN TELEPHONE & TELEGRAPH·Filed 1987·Granted Nov 15, 1988·45 cites·2 claims
- 0469US5470783AMethod for integrated circuit device isolationAT & T CORP·Filed 1995·Granted Nov 28, 1995·47 cites·10 claims
- 0568US4824796AProcess for manufacturing semiconductor BICMOS deviceAMERICAN TELEPHONE & TELEGRAPH·Filed 1987·Granted Apr 25, 1989·32 cites·8 claims
- 0667US10784296B2Image sensor and manufacturing method thereforSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2019·Granted Sep 22, 2020·0 cites·14 claims
- 0762US8389390B2Method of impurity introduction and controlled surface removalCHIU TZU-YIN·Filed 2008·Granted Mar 5, 2013·1 cites·19 claims
- 0860US5989752AReconfigurable maskFiled 1996·Granted Nov 23, 1999·19 cites·9 claims
- 0959US8053178B2Mask-less method and structure for patterning photosensitive material using optical fibersSEMICONDUCTOR MFG INT SHANGHAI·Filed 2007·Granted Nov 8, 2011·1 cites·14 claims
- 1052US8828854B2Method of impurity introduction and controlled surface removalCHIU TZU-YIN·Filed 2013·Granted Sep 9, 2014·0 cites·15 claims
- 1150US8816449B2Self-aligned MOS structure with local interconnects and self-aligned source/drain polysilicon contactsSEMICONDUCTOR MFG INT SHANGHAI·Filed 2013·Granted Aug 26, 2014·0 cites·10 claims
- 1249US8936989B2Method for manufacturing semiconductor devices using self-aligned process to increase device packing densityCHIU TZU-YIN·Filed 2008·Granted Jan 20, 2015·0 cites·10 claims
- 1349US8351748B2Mask-less method and structure for patterning photosensitive material using optical fibersSEMICONDUCTOR MFG INT SHANGHAI·Filed 2011·Granted Jan 8, 2013·0 cites·15 claims
- 1449US2018175082A1Image sensor and manufacturing method thereforSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2017·Application pending·0 cites
- 1548US8598004B2Self aligned MOS structure with polysilicon contactCHIU TZU YIN·Filed 2008·Granted Dec 3, 2013·0 cites·12 claims
- 1646US9368503B2Semiconductor SRAM structuresSEMICONDUCTOR MFG INT CORP·Filed 2013·Granted Jun 14, 2016·0 cites·9 claims
- 1745US7932997B2Reconfigurable mask method and device using MEMS for manufacturing integrated circuitsSEMICONDUCTOR MFG INT SHANGHAI·Filed 2006·Granted Apr 26, 2011·0 cites·15 claims
- 1845US4980304AProcess for fabricating a bipolar transistor with a self-aligned contactAT & T BELL LAB·Filed 1990·Granted Dec 25, 1990·12 cites·5 claims
- 1945US2008243292A1Method of defect detection based on wafer rotationCHIU TZU-YIN·Filed 2008·Application pending·0 cites
- 2044US9263548B2Method for manufacturing semiconductor devices using self-aligned process to increase device packing densityCHIU TZU-YIN·Filed 2015·Granted Feb 16, 2016·0 cites·20 claims
- 2144US2020243206A1Nuclides Bombardment Method and System for Neutron GenerationCHIU TZU YIN·Filed 2020·Application pending·0 cites
- 2243US10629646B2Image sensor including doped regions and manufacturing method thereforSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2017·Granted Apr 21, 2020·0 cites·14 claims
- 2338US2016078970A1Method and system for thermal nuclear fusionSEMICONDUCTOR MFG INT SHANGHAI·Filed 2015·Application pending·0 cites
- 2436US10411018B2SRAM memory cell and SRAM memory with conductive interconnectSEMICONDUCTOR MFG INTERNATIONAL CORP·Filed 2016·Granted Sep 10, 2019·0 cites·20 claims
- 2536US5106783AProcess for fabricating semiconductor devices with self-aligned contactsAT & T BELL LAB·Filed 1990·Granted Apr 21, 1992·10 cites·5 claims
- 2631US4992848ASelf-aligned contact technologyAT & T BELL LAB·Filed 1990·Granted Feb 12, 1991·6 cites·9 claims
- 2729US5462888AProcess for manufacturing semiconductor BICMOS deviceAT & T CORP·Filed 1994·Granted Oct 31, 1995·6 cites·7 claims
- 2828US10062704B2Buried-channel MOSFET and a surface-channel MOSFET of a same type and fabrication method thereofSEMICONDUCTOR MFG INT BEIJING CORP·Filed 2016·Granted Aug 28, 2018·0 cites·17 claims
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