Inventor · disambiguated record
Samie B. Samaan
Also filed as: SAMAAN SAMIE · SAMAAN SAMIE B
11 granted patents·2 pending applications·176 citations·filing 2000–2016
90Inventor score
Top patents by PatentIndex Score
13 records- 0193US6535013B2Parameter variation probing techniqueINTEL CORP·Filed 2000·Granted Mar 18, 2003·82 cites·31 claims
- 0291US9696350B2Non-linear control for voltage regulatorINTEL CORP·Filed 2013·Granted Jul 4, 2017·8 cites·22 claims
- 0377US6891442B2Ring oscillator gates in a matrix for aberrant logic gate timing detectionINTEL CORP·Filed 2003·Granted May 10, 2005·21 cites·30 claims
- 0475US7463992B2Method and system to self-test single and multi-core CPU systemsINTEL CORP·Filed 2006·Granted Dec 9, 2008·9 cites·10 claims
- 0572US10198333B2Test, validation, and debug architectureTROBOUGH MARK B·Filed 2010·Granted Feb 5, 2019·6 cites·20 claims
- 0669US7711898B2Register alias table cache to map a logical register to a physical registerINTEL CORP·Filed 2003·Granted May 4, 2010·14 cites·20 claims
- 0768US6737880B2Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissionsINTEL CORP·Filed 2001·Granted May 18, 2004·13 cites·18 claims
- 0866US7193427B2Method and apparatus for measuring relative, within-die leakage current and/or providing a temperature variation profile using a leakage inverter and ring oscillatorINTEL CORP·Filed 2004·Granted Mar 20, 2007·13 cites·28 claims
- 0961US6677783B2High-speed, state-preserving, race-reducing, wide-pulsed-clock domino design styleINTEL CORP·Filed 2001·Granted Jan 13, 2004·10 cites·24 claims
- 1045US10009339B2System, apparatus and method for securely protecting a processor in transitINTEL CORP·Filed 2016·Granted Jun 26, 2018·0 cites·17 claims
- 1143US2005138297A1Register file cacheINTEL CORP·Filed 2003·Application pending·0 cites
- 1242US7363430B2Determination of cache entry for future operationINTEL CORP·Filed 2005·Granted Apr 22, 2008·0 cites·17 claims
- 1331US2004263200A1A method and apparatus for measuring leakage current and/or temperature variationFiled 2003·Application pending·0 cites
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