Inventor · disambiguated record
Gerald Chan
Also filed as: CHAN GERALD · CHAN GERALD S · CHAN GERALD S C
16 granted patents·3 pending applications·139 citations·filing 2005–2020
93Inventor score
Top patents by PatentIndex Score
19 records- 0195US7482916B2Automatic signaling systems for vehiclesAU ANITA·Filed 2005·Granted Jan 27, 2009·39 cites·48 claims
- 0294US8378805B2Automatic signaling system for vehiclesAU ANITA·Filed 2011·Granted Feb 19, 2013·14 cites·26 claims
- 0393US7986223B2Automatic signaling system for vehiclesAU ANITA·Filed 2009·Granted Jul 26, 2011·20 cites·21 claims
- 0492US10162007B2Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independentlyADVANTEST CORP·Filed 2013·Granted Dec 25, 2018·13 cites·32 claims
- 0590US9505343B2Automatic control systems for vehiclesAU ANITA·Filed 2016·Granted Nov 29, 2016·5 cites·19 claims
- 0689US7568139B2Process for identifying the location of a break in a scan chain in real timeINOVYS CORP·Filed 2006·Granted Jul 28, 2009·21 cites·8 claims
- 0788US10293743B2Automatic control systems for vehiclesAU ANITA·Filed 2018·Granted May 21, 2019·3 cites·17 claims
- 0888US9248777B2Automatic signaling system for vehiclesAU ANITA·Filed 2013·Granted Feb 2, 2016·6 cites·23 claims
- 0987US10046696B2Automatic control systems for vehiclesAU ANITA·Filed 2016·Granted Aug 14, 2018·3 cites·19 claims
- 1071US11897388B2Camera systems for vehiclesAU ANITA·Filed 2020·Granted Feb 13, 2024·0 cites·23 claims
- 1167US8006149B2System and method for device performance characterization in physical and logical domains with AC SCAN testingVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 23, 2011·5 cites·12 claims
- 1266US10569700B2Automatic control systems for vehiclesAU ANITA·Filed 2019·Granted Feb 25, 2020·0 cites·20 claims
- 1365US8615691B2Process for improving design-limited yield by localizing potential faults from production test dataDOKKEN RICHARD C·Filed 2007·Granted Dec 24, 2013·5 cites·13 claims
- 1454US8453026B2Process for improving design limited yield by efficiently capturing and storing production test data for analysis using checksums, hash values, or digital fault signaturesCHAN GERALD S·Filed 2006·Granted May 28, 2013·3 cites·6 claims
- 1552US8060851B2Method for operating a secure semiconductor IP server to support failure analysisDOKKEN RICHARD C·Filed 2007·Granted Nov 15, 2011·2 cites·15 claims
- 1644US2014237292A1Gui implementations on central controller computer system for supporting protocol independent device testingADVANTEST CORP·Filed 2013·Application pending·0 cites
- 1742US2006168549A1User interfaces and methods for displaying attributes of objects and accessing contentCHAN ERIC·Filed 2005·Application pending·0 cites
- 1842US2014236527A1Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systemsADVANTEST CORP·Filed 2013·Application pending·0 cites
- 1939US9819962B2Efficient low-complexity video compressionATI TECHNOLOGIES ULC·Filed 2015·Granted Nov 14, 2017·0 cites·17 claims
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