Inventor · disambiguated record
You-Jin Wang
Also filed as: WANG YOU-JIN
15 granted patents·43 citations·filing 2008–2017
90Inventor score
Top patents by PatentIndex Score
15 records- 0192US8575573B2Structure for discharging extreme ultraviolet maskWANG YOU-JIN·Filed 2011·Granted Nov 5, 2013·14 cites·7 claims
- 0290US9113538B2Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet maskHERMES MICROVISION INC·Filed 2013·Granted Aug 18, 2015·9 cites·6 claims
- 0387US10054556B2Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet maskHERMES MICROVISION INC·Filed 2016·Granted Aug 21, 2018·3 cites·17 claims
- 0481US10176967B2Load lock system for charged particle beam imagingHERMES MICROVISION INC·Filed 2017·Granted Jan 8, 2019·3 cites·25 claims
- 0580US9572237B2Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet maskHERMES MICROVISION INC·Filed 2015·Granted Feb 14, 2017·2 cites·17 claims
- 0674US8302420B2Method for venting gas into closed space and gas supply assembly thereofWANG YOU-JIN·Filed 2009·Granted Nov 6, 2012·3 cites·20 claims
- 0773US8217349B2Method for inspecting EUV reticle and apparatus thereofKUAN CHIYAN·Filed 2010·Granted Jul 10, 2012·3 cites·9 claims
- 0870US8604428B2Method of controlling particle absorption on a wafer sample being inspected by a charged particle beam imaging systemWANG YOU-JIN·Filed 2011·Granted Dec 10, 2013·2 cites·17 claims
- 0970US8110818B2Method of controlling particle absorption on a wafer sample being inspected by a charged particle beam imaging systemWANG YOU-JIN·Filed 2008·Granted Feb 7, 2012·3 cites·19 claims
- 1063US8692193B2Method for inspecting EUV reticle and apparatus thereofKUAN CHIYAN·Filed 2012·Granted Apr 8, 2014·1 cites·32 claims
- 1161US8031344B2Z-stage configuration and application thereofHERMES MICROVISION INC·Filed 2009·Granted Oct 4, 2011·0 cites·20 claims
- 1254US9460887B2Discharging method for charged particle beam imagingWANG YOU-JIN·Filed 2009·Granted Oct 4, 2016·0 cites·20 claims
- 1352US7838848B2Patterning device holding apparatus and application thereofHERMES MICROVISION INC·Filed 2008·Granted Nov 23, 2010·0 cites·20 claims
- 1445US7868303B2Method and handling apparatus for placing patterning device on support member for charged particle beam imagingHERMES MICROVISION INC·Filed 2008·Granted Jan 11, 2011·0 cites·24 claims
- 1543US8089637B2Apparatus for detecting a sampleWANG YOU-JIN·Filed 2008·Granted Jan 3, 2012·0 cites·36 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →