Inventor · disambiguated record
Thorsten Trupke
Also filed as: TRUPKE THORSTEN
18 granted patents·9 pending applications·59 citations·filing 2006–2025
93Inventor score
Files withBT IMAGING PTY LTD14TRUPKE THORSTEN8NEWSOUTH INNOVATIONS PTY LTD3BARDOS ROBERT ANDREW1MAXWELL IAN A1
Top patents by PatentIndex Score
27 records- 0191US10502687B2Methods for inspecting semiconductor wafersBT IMAGING PTY LTD·Filed 2019·Granted Dec 10, 2019·3 cites·19 claims
- 0290US9885662B2Methods for inspecting semiconductor wafersBT IMAGING PTY LTD·Filed 2013·Granted Feb 6, 2018·7 cites·72 claims
- 0387US10241051B2Methods for inspecting semiconductor wafersBT IMAGING PTY LTD·Filed 2017·Granted Mar 26, 2019·2 cites·20 claims
- 0487US8064054B2Method and system for inspecting indirect bandgap semiconductor structureTRUPKE THORSTEN·Filed 2006·Granted Nov 22, 2011·11 cites·112 claims
- 0586US8710860B2Method and system for testing indirect bandgap semiconductor devices using luminescence imagingTRUPKE THORSTEN·Filed 2007·Granted Apr 29, 2014·8 cites·30 claims
- 0685US9482625B2Method and system for testing indirect bandgap semiconductor devices using luminescence imagingBT IMAGING PTY LTD·Filed 2014·Granted Nov 1, 2016·4 cites·16 claims
- 0784US8742372B2Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materialsTRUPKE THORSTEN·Filed 2010·Granted Jun 3, 2014·5 cites·42 claims
- 0882US9546955B2Wafer imaging and processing method and apparatusBT IMAGING PTY LTD·Filed 2015·Granted Jan 17, 2017·3 cites·29 claims
- 0979US9035267B2In-line photoluminescence imaging of semiconductor devicesMAXWELL IAN A·Filed 2011·Granted May 19, 2015·5 cites·65 claims
- 1078US9912291B2Method and system for testing indirect bandgap semiconductor devices using luminescence imagingBT IMAGING PTY LTD·Filed 2016·Granted Mar 6, 2018·1 cites·14 claims
- 1171US9103792B2Wafer imaging and processing method and apparatusTRUPKE THORSTEN·Filed 2009·Granted Aug 11, 2015·3 cites·20 claims
- 1271US7919762B2Determining diffusion length of minority carriers using luminescenceBT IMAGING PTY LTD·Filed 2007·Granted Apr 5, 2011·4 cites·18 claims
- 1367US9234849B2Method and system for inspecting indirect bandgap semiconductor structureTRUPKE THORSTEN·Filed 2012·Granted Jan 12, 2016·1 cites·32 claims
- 1467US8218140B2Method and system for inspecting indirect bandgap semiconductor stuctureTRUPKE THORSTEN·Filed 2011·Granted Jul 10, 2012·1 cites·112 claims
- 1562US2025192721A1Outdoor photoluminescence imaging of photovoltaic modulesNEWSOUTH INNOVATIONS PTY LTD·Filed 2025·Application pending·0 cites
- 1661US12255582B2Outdoor photoluminescence imaging of photovoltaic modulesNEWSOUTH INNOVATIONS PTY LTD·Filed 2021·Granted Mar 18, 2025·0 cites·27 claims
- 1760US8483476B2Photovoltaic cell manufacturingBARDOS ROBERT ANDREW·Filed 2008·Granted Jul 9, 2013·1 cites·38 claims
- 1860US2024283402A1Outdoor photoluminescence imaging of photovoltaic arrays via optical string modulationNEWSOUTH INNOVATIONS PTY LTD·Filed 2022·Application pending·0 cites
- 1957US9157863B2Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materialsBT IMAGING PTY LTD·Filed 2014·Granted Oct 13, 2015·0 cites·21 claims
- 2056US9909991B2Method and system for inspecting indirect bandgap semiconductor structureBT IMAGING PTY LTD·Filed 2016·Granted Mar 6, 2018·0 cites·32 claims
- 2151US2015219560A1In-line photoluminescence imaging of semiconductor devicesBT IMAGING PTY LTD·Filed 2015·Application pending·0 cites
- 2249US2016084764A1Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materialsBT IMAGING PTY LTD·Filed 2015·Application pending·0 cites
- 2348US2018159469A1Determining the condition of photovoltaic modulesBT IMAGING PTY LTD·Filed 2016·Application pending·0 cites
- 2448US2011117681A1Thin film imaging method and apparatusBT IMAGING PTY LTD·Filed 2009·Application pending·0 cites
- 2544US2014039820A1Quantitative series resistance imaging of photovoltaic cellsTRUPKE THORSTEN·Filed 2012·Application pending·0 cites
- 2641US2018159468A1Determining the condition of photovoltaic modulesBT IMAGING PTY LTD·Filed 2016·Application pending·0 cites
- 2740US2012142125A1Photoluminescence imaging systems for silicon photovoltaic cell manufacturingTRUPKE THORSTEN·Filed 2010·Application pending·0 cites
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