Inventor · disambiguated record
Katrin Fuhrer
Also filed as: FUHRER KATRIN
15 granted patents·1 pending application·409 citations·filing 2001–2010
95Inventor score
Top patents by PatentIndex Score
16 records- 0196US7365313B2Fast time-of-flight mass spectrometer with improved data acquisition systemIONWERKS·Filed 2006·Granted Apr 29, 2008·31 cites·17 claims
- 0296US7164122B2Ion mobility spectrometerIONWERKS INC·Filed 2005·Granted Jan 16, 2007·38 cites·92 claims
- 0395US7084393B2Fast time-of-flight mass spectrometer with improved data acquisition systemIONWERKS INC·Filed 2003·Granted Aug 1, 2006·54 cites·5 claims
- 0494US8492710B2Fast time-of-flight mass spectrometer with improved data acquisition systemFUHRER KATRIN·Filed 2010·Granted Jul 23, 2013·37 cites·26 claims
- 0594US7800054B2Fast time-of-flight mass spectrometer with improved dynamic rangeIONWERKS INC·Filed 2008·Granted Sep 21, 2010·21 cites·8 claims
- 0693US6747271B2Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitionIONWERKS·Filed 2001·Granted Jun 8, 2004·46 cites·16 claims
- 0792US8648294B2Compact aerosol time-of-flight mass spectrometerPRATHER KIMBERLY A·Filed 2007·Granted Feb 11, 2014·26 cites·24 claims
- 0891US6897437B2Mobility spectrometerIONWERKS·Filed 2001·Granted May 24, 2005·40 cites·106 claims
- 0991US6683299B2Time-of-flight mass spectrometer for monitoring of fast processesIONWERKS·Filed 2002·Granted Jan 27, 2004·47 cites·20 claims
- 1090US7291834B2Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitionsIONWERKS INC·Filed 2006·Granted Nov 6, 2007·10 cites·10 claims
- 1185US6909090B2Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitionsIONWERKS·Filed 2003·Granted Jun 21, 2005·17 cites·4 claims
- 1280US7145134B2Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitionsIONWERKS INC·Filed 2004·Granted Dec 5, 2006·11 cites·12 claims
- 1380US7084395B2Time-of-flight mass spectrometer for monitoring of fast processesIONWERKS INC·Filed 2004·Granted Aug 1, 2006·16 cites·34 claims
- 1474US7935922B2Ion guide chamberTOFWERK AG·Filed 2008·Granted May 3, 2011·3 cites·17 claims
- 1574US7019286B2Time-of-flight mass spectrometer for monitoring of fast processesIONWERKS INC·Filed 2003·Granted Mar 28, 2006·12 cites·14 claims
- 1650US2008149825A1Apparatus for mass analysis of ionsTOFWERK AG·Filed 2007·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →