Inventor · disambiguated record
Masaki Hasegawa
Also filed as: HASEGAWA MASAKI
95 granted patents·31 pending applications·1,193 citations·filing 1986–2023
99Inventor score
Files withHITACHI HIGH TECH CORP21MATSUSHITA ELECTRIC INDUSTRIAL CO LTD17IBM16HASEGAWA MASAKI10PANASONIC CORP10
Top patents by PatentIndex Score
126 records- 0196US7326942B2Ion beam system and machining methodHITACHI HIGH TECH CORP·Filed 2005·Granted Feb 5, 2008·24 cites·16 claims
- 0296US5370948AProcess for production of positive electrode active material for nonaqueous electrolyte lithium secondary cellMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1993·Granted Dec 6, 1994·118 cites·4 claims
- 0395US6797954B2Patterned wafer inspection method and apparatus thereforHITACHI LTD·Filed 2003·Granted Sep 28, 2004·42 cites·7 claims
- 0491US7952083B2Ion beam system and machining methodHITACHI HIGH TECH CORP·Filed 2008·Granted May 31, 2011·11 cites·6 claims
- 0591US7521676B2Method and apparatus for inspecting pattern defects and mirror electron projection type or multi-beam scanning type electron beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 21, 2009·16 cites·19 claims
- 0691US7447405B1Ferrule for optical wave guideIBM·Filed 2006·Granted Nov 4, 2008·17 cites·4 claims
- 0790US6979823B2Patterned wafer inspection method and apparatus thereforHITACHI LTD·Filed 2004·Granted Dec 27, 2005·21 cites·9 claims
- 0889US5609975APositive electrode for non-aqueous electrolyte lithium secondary battery and method of manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Mar 11, 1997·98 cites·13 claims
- 0987US7242015B2Patterned wafer inspection method and apparatus thereforHITACHI LTD·Filed 2005·Granted Jul 10, 2007·6 cites·21 claims
- 1086US7394066B2Electron microscope and electron beam inspection systemHITACHI HIGH TECH CORP·Filed 2005·Granted Jul 1, 2008·8 cites·6 claims
- 1185US7212713B2Optical transmission substrate, method for manufacturing optical transmission substrate and optoelectronic integrated circuitIBM·Filed 2004·Granted May 1, 2007·27 cites·15 claims
- 1284US6476390B1Method and apparatus for inspecting integrated circuit pattern using a plurality of charged particle beamsHITACHI LTD·Filed 1998·Granted Nov 5, 2002·68 cites·16 claims
- 1383US11002687B2Defect inspection method and defect inspection deviceHITACHI HIGH TECH CORP·Filed 2016·Granted May 11, 2021·2 cites·10 claims
- 1482US11193895B2Semiconductor substrate for evaluation and method using same to evaluate defect detection sensitivity of inspection deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Dec 7, 2021·2 cites·15 claims
- 1582US6347742B2Variable focal length lensesIBM·Filed 2001·Granted Feb 19, 2002·30 cites·20 claims
- 1681US7369728B1Ferrule for optical wave guideIBM·Filed 2007·Granted May 6, 2008·7 cites·15 claims
- 1781US5296319ANon-aqueous electrolyte secondary batteryMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted Mar 22, 1994·61 cites·3 claims
- 1880US5609680ACement, cement products, molding material, a concrete member and a method of producing the sameMAETA CONCRETE INDUSTRY LTD·Filed 1995·Granted Mar 11, 1997·33 cites·7 claims
- 1979US7288948B2Patterned wafer inspection method and apparatus thereforHITACHI HIGH TECH CORP·Filed 2004·Granted Oct 30, 2007·15 cites·14 claims
- 2079US5316875ASecondary battery with nonaqueous electrolyte and method of manufacturing sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted May 31, 1994·58 cites·5 claims
- 2178US7947396B2Negative electrode for non-aqueous electrolyte secondary battery, method of manufacturing the same, and non-aqueous electrolyte secondary battery using the samePANASONIC CORP·Filed 2007·Granted May 24, 2011·3 cites·16 claims
- 2278US7547884B2Pattern defect inspection method and apparatus thereofHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 16, 2009·4 cites·23 claims
- 2377US5764326AMultiple direction rotatable liquid crystal display device and a method for its manufactureIBM·Filed 1995·Granted Jun 9, 1998·53 cites·7 claims
- 2476US10126475B2Polarized light emissive deviceMERCK PATENT GMBH·Filed 2015·Granted Nov 13, 2018·2 cites·20 claims
- 2576US7566871B2Method and apparatus for pattern inspectionHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 28, 2009·3 cites·10 claims
- 2675US7537862B2Negative electrode for non-aqueous electrolyte secondary battery and non-aqueous electrolyte secondary battery comprising the samePANASONIC CORP·Filed 2005·Granted May 26, 2009·2 cites·10 claims
- 2774US9799925B2Nonaqueous electrolyte secondary batterySANYO ELECTRIC CO·Filed 2014·Granted Oct 24, 2017·1 cites·3 claims
- 2874US8029933B2Negative electrode for non-aqueous electrolyte secondary battery, method for manufacturing the same, and non-aqueous electrolyte secondary battery using the samePANASONIC CORP·Filed 2007·Granted Oct 4, 2011·2 cites·8 claims
- 2974US7889958B2Ferrule for optical wave guideIBM·Filed 2008·Granted Feb 15, 2011·4 cites·6 claims
- 3074US7755776B2Inspection system and inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 13, 2010·3 cites·9 claims
- 3174US7330247B2Apparatus and method for connecting optical waveguidesIBM·Filed 2005·Granted Feb 12, 2008·5 cites·18 claims
- 3274US5631105ANon-aqueous electrolyte lithium secondary batteryMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted May 20, 1997·48 cites·6 claims
- 3373US8563157B2Nonaqueous electrolyte secondary battery and method for manufacturing the sameHASEGAWA MASAKI·Filed 2008·Granted Oct 22, 2013·2 cites·11 claims
- 3473US5474861AElectrode for non-aqueous electrolyte secondary batteryMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1994·Granted Dec 12, 1995·44 cites·17 claims
- 3573US5217826ALithium-ion conducting solid electrolyteMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1991·Granted Jun 8, 1993·31 cites·1 claims
- 3670US10923315B2Charged particle beam apparatus, and method of adjusting charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2017·Granted Feb 16, 2021·1 cites·11 claims
- 3770US8920976B2Nonaqueous electrolyte secondary batteryGOTO NATSUMI·Filed 2012·Granted Dec 30, 2014·1 cites·6 claims
- 3870US8389156B2Negative electrode for non-aqueous electrolyte secondary battery, method for producing the same, and non-aqueous electrolyte secondary batteryKASHIWAGI KATSUMI·Filed 2007·Granted Mar 5, 2013·2 cites·12 claims
- 3970US8318359B2Electrode for lithium secondary battery, lithium secondary battery and method for producing the sameTAKAHASHI KEIICHI·Filed 2006·Granted Nov 27, 2012·1 cites·18 claims
- 4069US2025105288A1Negative electrode for secondary battery and secondary batteryPANASONIC IP MAN CO LTD·Filed 2023·Application pending·0 cites
- 4168US7863565B2Electron beam inspection method and electron beam inspection apparatusHITACHI LTD·Filed 2008·Granted Jan 4, 2011·1 cites·15 claims
- 4268US6770400B2Negative electrode material for nonaqueous electrolyte secondary battery and method for producing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Aug 3, 2004·8 cites·2 claims
- 4368US5490320AMethod of making a positive electrode for lithium secondary batteryMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1993·Granted Feb 13, 1996·36 cites·4 claims
- 4467US10103382B2Nonaqueous electrolyte secondary batteryPANASONIC IP MAN CO LTD·Filed 2016·Granted Oct 16, 2018·0 cites·8 claims
- 4567US8399129B2Negative electrode for lithium secondary battery, and lithium secondary battery including the sameUGAJI MASAYA·Filed 2007·Granted Mar 19, 2013·1 cites·15 claims
- 4667US7421858B2Optical transmission substrate, method for manufacturing optical transmission substrate and optoelectronic integrated circuitIBM·Filed 2007·Granted Sep 9, 2008·3 cites·25 claims
- 4767US5262255ANegative electrode for non-aqueous electrolyte secondary batteryMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted Nov 16, 1993·36 cites·7 claims
- 4867US2015099177A1Nonaqueous electrolyte secondary batteryPANASONIC CORP·Filed 2014·Application pending·0 cites
- 4966US8288722B2Electron beam inspection method and electron beam inspection apparatusHASEGAWA MASAKI·Filed 2010·Granted Oct 16, 2012·1 cites·12 claims
- 5066US6317190B1Variable focal length liquid crystal lens assembly and method of manufactureIBM·Filed 1999·Granted Nov 13, 2001·33 cites·17 claims
Showing the top 50 of 126 patent records by PatentIndex Score.
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