Inventor · disambiguated record
Ebrahim H. Hargan
Also filed as: HARGAN EBRAHIM · HARGAN EBRAHIM H
23 granted patents·1 pending application·342 citations·filing 2003–2018
96Inventor score
Top patents by PatentIndex Score
24 records- 0197US8103928B2Multiple device apparatus, systems, and methodsHARGAN EBRAHIM H·Filed 2008·Granted Jan 24, 2012·65 cites·24 claims
- 0296US8127204B2Memory system and method using a memory device die stacked with a logic die using data encoding, and system using the memory systemHARGAN EBRAHIM·Filed 2008·Granted Feb 28, 2012·100 cites·25 claims
- 0396US7977962B2Apparatus and methods for through substrate via testMICRON TECHNOLOGY INC·Filed 2008·Granted Jul 12, 2011·55 cites·12 claims
- 0493US7248088B2Devices and methods for controlling a slew rate of a signal lineMICRON TECHNOLOGY INC·Filed 2006·Granted Jul 24, 2007·18 cites·20 claims
- 0586US8063491B2Stacked device conductive path connectivityHARGAN EBRAHIM H·Filed 2008·Granted Nov 22, 2011·12 cites·30 claims
- 0686US8023350B2Memory malfunction prediction system and methodMICRON TECHNOLOGY INC·Filed 2010·Granted Sep 20, 2011·9 cites·20 claims
- 0785US8847619B2Apparatus and methods for through substrate via testHARGAN EBRAHIM H·Filed 2011·Granted Sep 30, 2014·7 cites·9 claims
- 0885US8826101B2Memory system and method using a memory device die stacked with a logic die using data encoding, and system using the memory systemMICRON TECHNOLOGY INC·Filed 2013·Granted Sep 2, 2014·6 cites·21 claims
- 0983US8578591B2Method for manufacturing a stacked device conductive path connectivityHARGAN EBRAHIM H·Filed 2011·Granted Nov 12, 2013·6 cites·18 claims
- 1083US8539312B2Memory system and method using a memory device die stacked with a logic die using data encoding, and system using the memory systemHARGAN EBRAHIM·Filed 2012·Granted Sep 17, 2013·6 cites·20 claims
- 1181US7126394B2History-based slew rate control to reduce intersymbol interferenceMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 24, 2006·16 cites·22 claims
- 1280US9318394B2Apparatus and methods for through substrate via testMICRON TECHNOLOGY INC·Filed 2014·Granted Apr 19, 2016·4 cites·18 claims
- 1374US10037926B2Apparatus and methods for through substrate via testMICRON TECHNOLOGY INC·Filed 2016·Granted Jul 31, 2018·2 cites·20 claims
- 1471US6807114B2Method and system for selecting redundant rows and columns of memory cellsMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 19, 2004·16 cites·75 claims
- 1566US7692463B2Devices and methods for controlling a slew rate of a signal lineMICRON TECHNOLOGY INC·Filed 2007·Granted Apr 6, 2010·3 cites·20 claims
- 1663US8174299B2Devices and methods for controlling a slew rate of a signal lineHARGAN EBRAHIM H·Filed 2010·Granted May 8, 2012·1 cites·20 claims
- 1762US7054207B2Method and system for selecting redundant rows and columns of memory cellsMICRON TECHNOLOGY INC·Filed 2004·Granted May 30, 2006·10 cites·70 claims
- 1853US10629502B2Apparatus and methods for through substrate via testMICRON TECHNOLOGY INC·Filed 2018·Granted Apr 21, 2020·0 cites·13 claims
- 1953US7773441B2Memory malfunction prediction system and methodMICRON TECHNOLOGY INC·Filed 2008·Granted Aug 10, 2010·2 cites·19 claims
- 2052US8570860B2Redundant signal transmissionHARGAN EBRAHIM H·Filed 2008·Granted Oct 29, 2013·0 cites·24 claims
- 2151US2014056127A1Redundant signal transmissionMICRON TECHNOLOGY INC·Filed 2013·Application pending·0 cites
- 2248US7336547B2Memory device having conditioning output dataMICRON TECHNOLOGY INC·Filed 2004·Granted Feb 26, 2008·4 cites·56 claims
- 2343US8418014B2Multiple device apparatus, systems, and methodsHARGAN EBRAHIM H·Filed 2012·Granted Apr 9, 2013·0 cites·25 claims
- 2440US7643370B2Memory device having conditioning output dataMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 5, 2010·0 cites·26 claims
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