Inventor · disambiguated record
Huang-Hui Wu
Also filed as: WU HUANG-HUI
6 granted patents·52 citations·filing 1999–1999
81Inventor score
Files withUNITED MICROELECTRONICS CORP6
Top patents by PatentIndex Score
6 records- 0158US6204096B1Method for reducing critical dimension of dual damascene process using spin-on-glass processUNITED MICROELECTRONICS CORP·Filed 1999·Granted Mar 20, 2001·24 cites·12 claims
- 0249US6255162B1Method of gap fillingUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jul 3, 2001·15 cites·16 claims
- 0337US6239024B1Method of filling gap with dielectricsUNITED MICROELECTRONICS CORP·Filed 1999·Granted May 29, 2001·7 cites·22 claims
- 0431US6284645B1Controlling improvement of critical dimension of dual damasceue process using spin-on-glass processUNITED MICROELECTRONICS CORP·Filed 1999·Granted Sep 4, 2001·3 cites·10 claims
- 0530US6248662B1Method of improving gap filling characteristics of dielectric layer by implantationUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jun 19, 2001·2 cites·19 claims
- 0627US6239027B1Method using a photoresist residueUNITED MICROELECTRONICS CORP·Filed 1999·Granted May 29, 2001·1 cites·7 claims
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