Inventor · disambiguated record
Chao-Hsin Chang
Also filed as: CHANG CHAO-HSIN
15 granted patents·2 pending applications·267 citations·filing 1996–2023
93Inventor score
Top patents by PatentIndex Score
17 records- 0186US6017771AMethod and system for yield loss analysis by yield management systemTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Jan 25, 2000·80 cites·6 claims
- 0274US7003365B1System and method of reserving capacity for a pre-process orderTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Feb 21, 2006·12 cites·29 claims
- 0371US5783493AMethod for reducing precipitate defects using a plasma treatment post BPSG etchbackTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Jul 21, 1998·43 cites·13 claims
- 0467US6728586B2Microelectronic fabrication production control method and system providing enhanced microelectronic fabrication facility utilization flexibilityTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Apr 27, 2004·3 cites·6 claims
- 0565US12104951B2Photocoupler sensing circuit and operation method thereofWISTRON CORP·Filed 2023·Granted Oct 1, 2024·0 cites·20 claims
- 0664US5877064AMethod for marking a waferTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Mar 2, 1999·30 cites·13 claims
- 0763US6389323B1Method and system for yield loss analysis by yield management systemTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted May 14, 2002·26 cites·6 claims
- 0863US5874309AMethod for monitoring metal corrosion on integrated circuit wafersTAIWAN SEMICONDUCTOR MFG·Filed 1996·Granted Feb 23, 1999·20 cites·10 claims
- 0962US5783097AProcess to avoid dielectric damage at the flat edge of the waterTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Jul 21, 1998·28 cites·20 claims
- 1057US7818896B2Sole ventilation systemHSIEH KAN-ZEN·Filed 2007·Granted Oct 26, 2010·9 cites·6 claims
- 1152US2002095366A1Capacity auction method and system providing enhanced fabrication facility utilizationTAIWAN SEMICONDUCTOR MFG·Filed 2001·Application pending·0 cites
- 1246US6500680B1Service code system and method for scheduling fabrication facility utilizationTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Dec 31, 2002·4 cites·8 claims
- 1340US6261843B1Test pattern for monitoring metal corrosion on integrated circuit wafersTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Jul 17, 2001·6 cites·7 claims
- 1437US2007042532A1System and methods for packing in turnkey servicesTAIWAN SEMICONDUCTOR MFG·Filed 2005·Application pending·0 cites
- 1534US9825454B2Protection device and method for electronic deviceWISTRON CORP·Filed 2015·Granted Nov 21, 2017·0 cites·16 claims
- 1630US6153497AMethod for determining a cause for defects in a film deposited on a waferTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Nov 28, 2000·3 cites·18 claims
- 1729US6308576B1Method for determining stress effect on a film during scrubber cleanTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Oct 30, 2001·3 cites·18 claims
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