Inventor · disambiguated record
Yoshinori Ueji
Also filed as: UEJI YOSHINORI
9 granted patents·3 pending applications·44 citations·filing 2006–2014
84Inventor score
Top patents by PatentIndex Score
12 records- 0193US9335282B2X-ray topography apparatusRIGAKU DENKI CO LTD·Filed 2013·Granted May 10, 2016·15 cites·6 claims
- 0290US9658174B2X-ray topography apparatusRIGAKU DENKI CO LTD·Filed 2014·Granted May 23, 2017·10 cites·6 claims
- 0386US9046471B2X-ray measurement apparatusRIGAKU DENKI CO LTD·Filed 2013·Granted Jun 2, 2015·11 cites·19 claims
- 0465US8022429B2Light emitting deviceNEC LIGHTING LTD·Filed 2011·Granted Sep 20, 2011·2 cites·2 claims
- 0563US8523391B2Flat light source apparatus with separable unit boardsISHIZUKA MASAHIRO·Filed 2006·Granted Sep 3, 2013·5 cites·20 claims
- 0656US9006673B2X-ray analysis apparatus, X-ray analysis system, X-ray analysis method, and X-ray analysis programRIGAKU DENKI CO LTD·Filed 2013·Granted Apr 14, 2015·1 cites·11 claims
- 0750US7977697B2Light emitting deviceNEC LIGHTING LTD·Filed 2009·Granted Jul 12, 2011·0 cites·6 claims
- 0842US8475007B2Light emitting deviceUEJI YOSHINORI·Filed 2009·Granted Jul 2, 2013·0 cites·5 claims
- 0938US2013201655A1Light emitting deviceUEJI YOSHINORI·Filed 2013·Application pending·0 cites
- 1037US2013126745A1Semiconductor x-ray detectorWATANABE YOSHIAKI·Filed 2011·Application pending·0 cites
- 1136US2010102344A1Led device and illuminating apparatusUEJI YOSHINORI·Filed 2008·Application pending·0 cites
- 1234US9518940B2X-ray diffraction method and portable X-ray diffraction apparatus using sameNAKANO ASAO·Filed 2011·Granted Dec 13, 2016·0 cites·17 claims
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