Inventor · disambiguated record
Viktor Koldiaev
Also filed as: KOLDIAEV VIKTOR · KOLDIAEV VIKTOR I
21 granted patents·10 pending applications·220 citations·filing 2003–2025
96Inventor score
Top patents by PatentIndex Score
31 records- 0198US12241924B2Wafer metrology technologiesFEMTOMETRIX INC·Filed 2022·Granted Mar 4, 2025·3 cites·19 claims
- 0298US11821911B2Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2021·Granted Nov 21, 2023·6 cites·6 claims
- 0398US11293965B2Wafer metrology technologiesFEMTOMETRIX INC·Filed 2020·Granted Apr 5, 2022·12 cites·14 claims
- 0498US11150287B2Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2020·Granted Oct 19, 2021·9 cites·16 claims
- 0598US10663504B2Field-biased second harmonic generation metrologyFEMTOMETRIX INC·Filed 2017·Granted May 26, 2020·14 cites·23 claims
- 0697US11988611B2Systems for parsing material properties from within SHG signalsFEMTOMETRIX INC·Filed 2021·Granted May 21, 2024·4 cites·18 claims
- 0797US10613131B2Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2018·Granted Apr 7, 2020·15 cites·22 claims
- 0897US10591525B2Wafer metrology technologiesFEMTOMETRIX INC·Filed 2017·Granted Mar 17, 2020·15 cites·32 claims
- 0996US11415617B2Field-biased second harmonic generation metrologyFEMTOMETRIX INC·Filed 2019·Granted Aug 16, 2022·9 cites·12 claims
- 1096US11199507B2Systems for parsing material properties from within SHG signalsFEMTOMETRIX INC·Filed 2019·Granted Dec 14, 2021·11 cites·9 claims
- 1196US10551325B2Systems for parsing material properties from within SHG signalsFEMTOMETRIX INC·Filed 2015·Granted Feb 4, 2020·19 cites·8 claims
- 1295US8796085B2Vertical super-thin body semiconductor on dielectric wall devices and methods of their fabricationKOLDIAEV VIKTOR·Filed 2013·Granted Aug 5, 2014·39 cites·21 claims
- 1391US9093304B2Vertical super-thin body semiconductor on dielectric wall devices and methods of their fabricationKOLDIAEV VIKTOR·Filed 2013·Granted Jul 28, 2015·14 cites·27 claims
- 1490US9520501B2Vertical super-thin body semiconductor on dielectric wall devices and methods of their fabricationFINSCALE INC·Filed 2015·Granted Dec 13, 2016·12 cites·18 claims
- 1584US8189376B2Integrated circuit having memory cells including gate material having high work function, and method of manufacturing sameKOLDIAEV VIKTOR·Filed 2009·Granted May 29, 2012·12 cites·38 claims
- 1682US2025093277A1Systems for parsing material properties from within shg signalsFEMTOMETRIX INC·Filed 2024·Application pending·0 cites
- 1779US8748959B2Semiconductor memory deviceVAN BUSKIRK MICHAEL A·Filed 2010·Granted Jun 10, 2014·5 cites·22 claims
- 1879US2025155486A1Wafer metrology technologiesFEMTOMETRIX INC·Filed 2025·Application pending·0 cites
- 1971US8537610B2Techniques for providing a semiconductor memory deviceOKHONIN SERGUEI·Filed 2010·Granted Sep 17, 2013·2 cites·35 claims
- 2070US7087507B2Implantation of deuterium in MOS and DRAM devicesPDF SOLUTIONS INC·Filed 2004·Granted Aug 8, 2006·17 cites·25 claims
- 2166US2018292441A1Charge decay measurement systems and methodsFEMTOMETRIX INC·Filed 2018·Application pending·0 cites
- 2265US9331083B2Techniques for providing a semiconductor memory deviceMICRON TECHNOLOGY INC·Filed 2014·Granted May 3, 2016·1 cites·19 claims
- 2364US9093311B2Techniques for providing a semiconductor memory deviceMICRON TECHNOLOGY INC·Filed 2014·Granted Jul 28, 2015·1 cites·23 claims
- 2460US2015331036A1Field-biased second harmonic generation metrologyFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
- 2560US2015330908A1Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
- 2660US2015330909A1Wafer metrology techonologiesFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
- 2760US2015331029A1Charge decay measurement systems and methodsFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
- 2855US8817534B2Techniques for providing a semiconductor memory deviceMICRON TECHNOLOGY INC·Filed 2013·Granted Aug 26, 2014·0 cites·25 claims
- 2949US2017186882A1Vertical super-thin body semiconductor on dielectric wall devices and methods of their fabricationFINSCALE INC·Filed 2016·Application pending·0 cites
- 3048US2009200635A1Integrated Circuit Having Electrical Isolation Regions, Mask Technology and Method of Manufacturing SameKOLDIAEV VIKTOR·Filed 2009·Application pending·0 cites
- 3131US2005040479A1Oxide-Nitride-Oxide spacer with oxide layers free of nitridizationPDF SOLUTIONS·Filed 2003·Application pending·0 cites
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