Inventor · disambiguated record
Ishtiaq Ahsan
Also filed as: AHSAN ISHTIAQ
11 granted patents·5 pending applications·210 citations·filing 2004–2024
89Inventor score
Top patents by PatentIndex Score
16 records- 0197US8039837B2In-line voltage contrast detection of PFET silicide encroachmentIBM·Filed 2009·Granted Oct 18, 2011·83 cites·12 claims
- 0297US7733109B2Test structure for resistive open detection using voltage contrast inspection and related methodsIBM·Filed 2007·Granted Jun 8, 2010·92 cites·29 claims
- 0378US7515502B1Memory array peripheral structures and useIBM·Filed 2007·Granted Apr 7, 2009·12 cites·3 claims
- 0471US8610451B2Post silicide testing for replacement high-k metal gate technologiesAHSAN ISHTIAQ·Filed 2010·Granted Dec 17, 2013·5 cites·20 claims
- 0568US7119545B2Capacitive monitors for detecting metal extrusion during electromigrationIBM·Filed 2004·Granted Oct 10, 2006·11 cites·11 claims
- 0667US7719005B2Structure and method for monitoring and characterizing pattern density dependence on thermal absorption in a semiconductor manufacturing processINTERNAT BURINESS MACHINES COR·Filed 2007·Granted May 18, 2010·4 cites·12 claims
- 0757US2025383398A1Testing device for testing semiconductorsIBM·Filed 2024·Application pending·0 cites
- 0857US2025383397A1Testing device for testing semiconductors and methods of fabricationIBM·Filed 2024·Application pending·0 cites
- 0957US2025372463A1Testing structure for semiconductor devicesIBM·Filed 2024·Application pending·0 cites
- 1055US7612371B2Structure to monitor arcing in the processing steps of metal layer build on silicon-on-insulator semiconductorsIBM·Filed 2006·Granted Nov 3, 2009·1 cites·11 claims
- 1155US2025169050A1Second-level metallization testable fully integrated and multi-functional static random access memory and scannable latchesIBM·Filed 2023·Application pending·0 cites
- 1252US7408421B2Determining thermal absorption using ring oscillatorIBM·Filed 2006·Granted Aug 5, 2008·2 cites·2 claims
- 1352US7396694B2Structure for monitoring semiconductor polysilicon gate profileIBM·Filed 2006·Granted Jul 8, 2008·0 cites·5 claims
- 1444US7135346B2Structure for monitoring semiconductor polysilicon gate profileIBM·Filed 2004·Granted Nov 14, 2006·0 cites·10 claims
- 1539US7781239B2Semiconductor device defect type determination method and structureIBM·Filed 2008·Granted Aug 24, 2010·0 cites·11 claims
- 1637US2015294738A1Test structure and method of testing a microchipIBM·Filed 2014·Application pending·0 cites
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