P

Inventor

SHAH UDAY

US133 patents
⚠️ This page may combine multiple inventors who share the name “SHAH UDAY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

39 patents
US7825437B2Nov 2, 2010

Unity beta ratio tri-gate transistor static random access memory (SRAM)

INTEL CORP166 citations99
US7531437B2May 12, 2009

Method of forming metal gate electrodes using sacrificial gate electrode material and sacrificial gate dielectric material

INTEL CORP195 citations99
US7898041B2Mar 1, 2011

Block contact architectures for nanoscale channel transistors

INTEL CORP113 citations98
US7745270B2Jun 29, 2010

Tri-gate patterning using dual layer gate stack

INTEL CORP121 citations98
US7547637B2Jun 16, 2009

Methods for patterning a semiconductor film

INTEL CORP52 citations98
US7479421B2Jan 20, 2009

Process for integrating planar and non-planar CMOS transistors on a bulk substrate and article made thereby

INTEL CORP105 citations98
US7407847B2Aug 5, 2008

Stacked multi-gate transistor design and method of fabrication

INTEL CORP99 citations98
US7390709B2Jun 24, 2008

Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode

INTEL CORP71 citations98
US7361958B2Apr 22, 2008

Nonplanar transistors with metal gate electrodes

INTEL CORP86 citations98
US7326656B2Feb 5, 2008

Method of forming a metal oxide dielectric

INTEL CORP456 citations98
US7279375B2Oct 9, 2007

Block contact architectures for nanoscale channel transistors

INTEL CORP93 citations98
US7220635B2May 22, 2007

Method for making a semiconductor device with a metal gate electrode that is formed on an annealed high-k gate dielectric layer

INTEL CORP78 citations98
US7208361B2Apr 24, 2007

Replacement gate process for making a semiconductor device that includes a metal gate electrode

INTEL CORP128 citations98
US7157378B2Jan 2, 2007

Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode

INTEL CORP107 citations98
US7153784B2Dec 26, 2006

Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode

INTEL CORP86 citations98
US7153734B2Dec 26, 2006

CMOS device with metal and silicide gate electrodes and a method for making it

INTEL CORP64 citations98
US7071064B2Jul 4, 2006

U-gate transistors and methods of fabrication

INTEL CORP96 citations97
US7550333B2Jun 23, 2009

Nonplanar device with thinned lower body portion and method of fabrication

INTEL CORP50 citations96
US7355281B2Apr 8, 2008

Method for making semiconductor device having a high-k gate dielectric layer and a metal gate electrode

INTEL CORP47 citations96
US7323423B2Jan 29, 2008

Forming high-k dielectric layers on smooth substrates

INTEL CORP49 citations96
US7176090B2Feb 13, 2007

Method for making a semiconductor device that includes a metal gate electrode

INTEL CORP58 citations96
US7138323B2Nov 21, 2006

Planarizing a semiconductor structure to form replacement metal gates

INTEL CORP51 citations96
US7528025B2May 5, 2009

Nonplanar transistors with metal gate electrodes

INTEL CORP52 citations95
US7718479B2May 18, 2010

Forming integrated circuits with replacement metal gate electrodes

INTEL CORP15 citations93
US7709312B2May 4, 2010

Methods for inducing strain in non-planar transistor structures

INTEL CORP34 citations93
US7435683B2Oct 14, 2008

Apparatus and method for selectively recessing spacers on multi-gate devices

INTEL CORP23 citations93
US7183184B2Feb 27, 2007

Method for making a semiconductor device that includes a metal gate electrode

INTEL CORP54 citations93
US7160767B2Jan 9, 2007

Method for making a semiconductor device that includes a metal gate electrode

INTEL CORP54 citations93
US6893927B1May 17, 2005

Method for making a semiconductor device with a metal gate electrode

INTEL CORP38 citations93
US6887800B1May 3, 2005

Method for making a semiconductor device with a high-k gate dielectric and metal layers that meet at a P/N junction

INTEL CORP23 citations93
US7785958B2Aug 31, 2010

Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode

INTEL CORP38 citations92
US7129182B2Oct 31, 2006

Method for etching a thin metal layer

INTEL CORP19 citations92
US7045428B2May 16, 2006

Method for making a semiconductor device with a high-k gate dielectric and a conductor that facilitates current flow across a P/N junction

INTEL CORP20 citations92
US7037845B2May 2, 2006

Selective etch process for making a semiconductor device having a high-k gate dielectric

INTEL CORP28 citations92
US6974764B2Dec 13, 2005

Method for making a semiconductor device having a metal gate electrode

INTEL CORP42 citations92
US6869889B1Mar 22, 2005

Etching metal carbide films

INTEL CORP24 citations91
US10439134B2Oct 8, 2019

Techniques for forming non-planar resistive memory cells

INTEL CORP12 citations84
US9825095B2Nov 21, 2017

Hybrid phase field effect transistor

INTEL CORP6 citations84
US9755062B2Sep 5, 2017

III-N material structure for gate-recessed transistors

INTEL CORP7 citations84

DOYLE BRIAN S

3 patents

PILLARISETTY RAVI

2 patents

SHAH UDAY

2 patents

BRASK JUSTIN K

1 patent

RACHMADY WILLY

1 patent

KAVALIEROS JACK T

1 patent

OGUZ KAAN

1 patent

Showing the top 50 of 133 patents by PatentIndex Score.