Inventor · disambiguated record
Alexander Tennant Sutherland
Also filed as: SUTHERLAND ALEXANDER T · SUTHERLAND ALEXANDER TENNANT
11 granted patents·395 citations·filing 1990–2008
93Inventor score
Top patents by PatentIndex Score
11 records- 0195US7900367B2Differential calibrationRENISHAW PLC·Filed 2007·Granted Mar 8, 2011·42 cites·15 claims
- 0294US6909983B2Calibration of an analogue probeRENISHAW PLC·Filed 2002·Granted Jun 21, 2005·82 cites·9 claims
- 0388US7866056B2Calibration method and apparatusRENISHAW PLC·Filed 2008·Granted Jan 11, 2011·20 cites·21 claims
- 0488US6434846B1Method of calibrating a scanning systemERENISHAW PLC·Filed 2000·Granted Aug 20, 2002·47 cites·5 claims
- 0585US6601311B2Method of calibrating a scanning systemRENISHAW PLC·Filed 2002·Granted Aug 5, 2003·27 cites·8 claims
- 0679US6131301AMethod of and apparatus for measuring workpieces using a coordinate positioning machineRENISHAW PLC·Filed 1998·Granted Oct 17, 2000·48 cites·16 claims
- 0778US6580964B2Calibrations of an analogue probe and error mappingRENISHAW PLC·Filed 2002·Granted Jun 17, 2003·24 cites·15 claims
- 0877US6810597B2Use of surface measuring probesRENISHAW PLC·Filed 2003·Granted Nov 2, 2004·23 cites·40 claims
- 0975US5334918AMethod of controlling a coordinate positioning machine for measurement of a workpieceRENISHAW PLC·Filed 1991·Granted Aug 2, 1994·43 cites·10 claims
- 1060US5499194AMethod for scanning the surface of an objectRENISHAW PLC·Filed 1994·Granted Mar 12, 1996·20 cites·25 claims
- 1158US5001842AError determination for multi-axis apparatus due to thermal distortionFERRANTI INT PLC·Filed 1990·Granted Mar 26, 1991·19 cites·12 claims
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