Inventor · disambiguated record
Michael Mauck
Also filed as: MAUCK MICHAEL · MAUCK MICHAEL S
9 granted patents·1 pending application·131 citations·filing 1980–2008
90Inventor score
Files withCOINCIDENT BEAMS LICENSING COR6ELECTRO SCIENT IND INC2ATTOFEMTO INC1COINCIDENT BEARNS LICENSING CO1
Top patents by PatentIndex Score
10 records- 0192US4337442AFirst laser pulse amplitude modulationELECTRO SCIENT IND INC·Filed 1980·Granted Jun 29, 1982·47 cites·7 claims
- 0279US7206078B2Non-destructive testing system using a laser beamATTOFEMTO INC·Filed 2003·Granted Apr 17, 2007·24 cites·10 claims
- 0376US6611087B2Method and apparatus for simultaneously depositing and observing materials on a targetCOINCIDENT BEAMS LICENSING COR·Filed 2002·Granted Aug 26, 2003·8 cites·8 claims
- 0475US7078852B2Method and apparatus for simultaneously depositing and observing materials on a targetCOINCIDENT BEAMS LICENSING COR·Filed 2005·Granted Jul 18, 2006·2 cites·17 claims
- 0572US6906453B2Method and apparatus for simultaneously depositing and observing materials on a targetCOINCIDENT BEAMS LICENSING COR·Filed 2004·Granted Jun 14, 2005·6 cites·17 claims
- 0668US7381949B2Method and apparatus for simultaneously depositing and observing materials on a targetCOINCIDENT BEARNS LICENSING CO·Filed 2006·Granted Jun 3, 2008·7 cites·17 claims
- 0768US6522056B1Method and apparatus for simultaneously depositing and observing materials on a targetCOINCIDENT BEAMS LICENSING COR·Filed 2000·Granted Feb 18, 2003·15 cites·137 claims
- 0866US4412330AQ-Switched laser with stable output and method of making the sameELECTRO SCIENT IND INC·Filed 1981·Granted Oct 25, 1983·18 cites·12 claims
- 0960US2008258073A1Method and apparatus for simultaneously depositing and observing materials on a targetCOINCIDENT BEAMS LICENSING COR·Filed 2008·Application pending·0 cites
- 1047US6815880B2Method and apparatus for simultaneously depositing and observing materials on a targetCOINCIDENT BEAMS LICENSING COR·Filed 2003·Granted Nov 9, 2004·4 cites·15 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →