Inventor · disambiguated record
John C. Stover
Also filed as: STOVER JOHN · STOVER JOHN C · STOVER JOHN CLYDE
21 granted patents·3 pending applications·930 citations·filing 1976–2014
97Inventor score
Files withADE OPTICAL SYST CORP6EMERSON ELECTRIC CO5SCATTER WORKS INC3ADE CORP2TMA TECHNOLOGIES INC2
Top patents by PatentIndex Score
24 records- 0194US6292259B1Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2000·Granted Sep 18, 2001·78 cites·42 claims
- 0293US6118525AWafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 1997·Granted Sep 12, 2000·122 cites·21 claims
- 0392US7007386B1Light duty bearing assemblyGEN SULLIVAN GROUP INC·Filed 2002·Granted Mar 7, 2006·40 cites·15 claims
- 0489US6509965B2Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2001·Granted Jan 21, 2003·38 cites·16 claims
- 0587US6169601B1Method and apparatus for distinguishing particles from subsurface defects on a substrate using polarized lightADE OPTICAL SYSTEMS·Filed 1999·Granted Jan 2, 2001·120 cites·20 claims
- 0687US4429845ARail track heatersEMERSON ELECTRIC CO·Filed 1982·Granted Feb 7, 1984·73 cites·5 claims
- 0787US4117308AExplosion-proof electric air heaterEMERSON ELECTRIC CO·Filed 1976·Granted Sep 26, 1978·48 cites·6 claims
- 0883US5406082ASurface inspection and characterization system and processTHIOKOL CORP·Filed 1992·Granted Apr 11, 1995·87 cites·39 claims
- 0982US6486946B1Method for discriminating between holes in and particles on a film covering a substrateADE CORP·Filed 2000·Granted Nov 26, 2002·26 cites·7 claims
- 1082US5416590AApparatus and process for measuring gap and mismatchTMA TECHNOLOGIES INC·Filed 1993·Granted May 16, 1995·57 cites·36 claims
- 1178US5955654ACalibration standard for microroughness measuring instrumentsVLSI STANDARDS INC·Filed 1997·Granted Sep 21, 1999·45 cites·6 claims
- 1277US6091493AProcess for particle size measurementSCATTER WORKS INC·Filed 1999·Granted Jul 18, 2000·53 cites·34 claims
- 1377US5196906AModular scatterometer with interchangeable scanning headsTMA TECHNOLOGIES INC·Filed 1990·Granted Mar 23, 1993·59 cites·19 claims
- 1476US9030657B2Device and method for subaperture stray light detection and diagnosisKUHN WILLIAM P·Filed 2012·Granted May 12, 2015·4 cites·13 claims
- 1572US6760100B2Method and apparatus for classifying defects occurring at or near a surface of a smooth substrateADE CORP·Filed 2001·Granted Jul 6, 2004·14 cites·41 claims
- 1671US6122047AMethods and apparatus for identifying the material of a particle occurring on the surface of a substrateADE OPTICAL SYST CORP·Filed 1999·Granted Sep 19, 2000·37 cites·32 claims
- 1768US6833028B1Particle deposition system with enhanced speed and diameter accuracySCATTER WORKS INC·Filed 2002·Granted Dec 21, 2004·11 cites·15 claims
- 1862US9804087B2Hemispherical scanning optical scatterometerScatterMaster LLC·Filed 2014·Granted Oct 31, 2017·1 cites·20 claims
- 1950US4468556AElectric heating elementsEMERSON ELECTRIC CO·Filed 1982·Granted Aug 28, 1984·11 cites·9 claims
- 2047USD256724SHeat exchanger grid for an electric heaterEMERSON ELECTRIC CO·Filed 1976·Granted Sep 2, 1980·4 cites·1 claims
- 2142US2004085533A1Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2003·Application pending·0 cites
- 2241US2005118332A1Particle deposition system with enhanced speed and diameter accuracySCATTER WORKS INC·Filed 2004·Application pending·0 cites
- 2341US2003071992A1Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2002·Application pending·0 cites
- 2437USD263734SMetal extrusion for an electric heating elementEMERSON ELECTRIC CO·Filed 1980·Granted Apr 6, 1982·2 cites·1 claims
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