Inventor · disambiguated record
Geoffrey Mcfarland
Also filed as: MCFARLAND GEOFFREY
41 granted patents·24 pending applications·576 citations·filing 2002–2023
98Inventor score
Top patents by PatentIndex Score
65 records- 0195US10933468B2Additive manufacturing method and apparatusRENISHAW PLC·Filed 2016·Granted Mar 2, 2021·8 cites·32 claims
- 0295US10399145B2Additive manufacturing apparatus and methodRENISHAW PLC·Filed 2014·Granted Sep 3, 2019·17 cites·23 claims
- 0395US8006398B2Method for scanning the surface of a workpieceRENISHAW PLC·Filed 2006·Granted Aug 30, 2011·42 cites·24 claims
- 0494US7293365B2Probe or stylus orientationRENISHAW PLC·Filed 2006·Granted Nov 13, 2007·26 cites·19 claims
- 0593US7809523B2Apparatus and method of measuring workpiecesRENISHAW PLC·Filed 2007·Granted Oct 5, 2010·40 cites·18 claims
- 0692US10479018B2Additive manufacturing apparatus and methodsRENISHAW PLC·Filed 2016·Granted Nov 19, 2019·6 cites·23 claims
- 0792US7523561B2Measuring methods for use on machine toolsRENISHAW PLC·Filed 2008·Granted Apr 28, 2009·22 cites·33 claims
- 0891US7055367B2Calibration of a probeRENISHAW PLC·Filed 2002·Granted Jun 6, 2006·53 cites·7 claims
- 0989US8474148B2Articulating probe head apparatus and methodJONAS KEVYN BARRY·Filed 2010·Granted Jul 2, 2013·11 cites·30 claims
- 1089US7861430B2Articulating probe head apparatus and methodRENISHAW PLC·Filed 2007·Granted Jan 4, 2011·20 cites·7 claims
- 1189US7543393B2Method of calibrating a scanning systemRENISHAW PLC·Filed 2007·Granted Jun 9, 2009·20 cites·17 claims
- 1287US8978261B2Probe head for scanning the surface of a workpieceMCFARLAND GEOFFREY·Filed 2011·Granted Mar 17, 2015·11 cites·12 claims
- 1387US7783445B2Method of path planningRENISHAW PLC·Filed 2006·Granted Aug 24, 2010·21 cites·20 claims
- 1487US7286949B2Method of error correctionRENISHAW PLC·Filed 2006·Granted Oct 23, 2007·19 cites·19 claims
- 1587US7254506B2Method of calibrating a scanning systemRENISHAW PLC·Filed 2003·Granted Aug 7, 2007·34 cites·15 claims
- 1685US8006399B2Surface sensing deviceRENISHAW PLC·Filed 2007·Granted Aug 30, 2011·16 cites·32 claims
- 1784US11123799B2Additive manufacturing apparatus and methodRENISHAW PLC·Filed 2019·Granted Sep 21, 2021·1 cites·10 claims
- 1884US8302321B2Apparatus and method of measuring workpiecesHUNTER STEPHEN PAUL·Filed 2011·Granted Nov 6, 2012·7 cites·36 claims
- 1983US7131207B2Workpiece inspection methodRENISHAW PLC·Filed 2003·Granted Nov 7, 2006·26 cites·24 claims
- 2083US2024083108A1Selective solidification apparatus and methodsRENISHAW PLC·Filed 2023·Application pending·0 cites
- 2182US7971365B2Apparatus and method of measuring workpiecesRENISHAW PLC·Filed 2007·Granted Jul 5, 2011·10 cites·16 claims
- 2281US8144340B2Surface sensing device with optical sensorMCFARLAND GEOFFREY·Filed 2010·Granted Mar 27, 2012·5 cites·15 claims
- 2381US7100297B2Probe or stylus orientationRENISHAW PLC·Filed 2003·Granted Sep 5, 2006·21 cites·18 claims
- 2481US2023042539A1Additive manufacturing method and apparatusRENISHAW PLC·Filed 2022·Application pending·0 cites
- 2579US11780161B2Additive manufacturing apparatus and methodsRENISHAW PLC·Filed 2022·Granted Oct 10, 2023·0 cites·25 claims
- 2678US7124514B2Probe for high speed scanningRENISHAW PLC·Filed 2003·Granted Oct 24, 2006·21 cites·18 claims
- 2777USRE45211ESurface sensing device with optical sensorRENISHAW PLC·Filed 2012·Granted Oct 28, 2014·3 cites·31 claims
- 2877US7456538B2Reaction balanced rotary drive mechanismRENISHAW PLC·Filed 2002·Granted Nov 25, 2008·22 cites·17 claims
- 2976US10994335B2Selective solidification apparatus and methodsRENISHAW PLC·Filed 2015·Granted May 4, 2021·1 cites·17 claims
- 3076US7318284B2Method of calibrating a scanning systemRENISHAW PLC·Filed 2004·Granted Jan 15, 2008·19 cites·26 claims
- 3175US7847955B2Surface sensing device with optical sensorRENISHAW PLC·Filed 2006·Granted Dec 7, 2010·6 cites·17 claims
- 3275US7594337B2Power and/or signal paths for a machine tool accessoryRENISHAW PLC·Filed 2006·Granted Sep 29, 2009·5 cites·20 claims
- 3374US2023100749A1Additive manufacturing method and systemRENISHAW PLC·Filed 2022·Application pending·0 cites
- 3474US2021146447A1Additive manufacturing method and apparatusRENISHAW PLC·Filed 2021·Application pending·0 cites
- 3573US11446863B2Additive manufacturing apparatus and methodsRENISHAW PLC·Filed 2019·Granted Sep 20, 2022·0 cites·15 claims
- 3673US2021299755A1Selective solidification apparatus and methodsRENISHAW PLC·Filed 2021·Application pending·0 cites
- 3770US7079969B2Dynamic artefact comparisonRENISHAW PLC·Filed 2003·Granted Jul 18, 2006·16 cites·10 claims
- 3869US7885777B2Probe calibrationRENISHAW PLC·Filed 2006·Granted Feb 8, 2011·6 cites·21 claims
- 3968US7086170B2Analogue probeRENISHAW PLC·Filed 2003·Granted Aug 8, 2006·14 cites·15 claims
- 4063US11548229B2Additive manufacturing method and systemRENISHAW PLC·Filed 2017·Granted Jan 10, 2023·0 cites·13 claims
- 4162US9541385B2Measurement method and apparatusJONAS KEVYN BARRY·Filed 2011·Granted Jan 10, 2017·4 cites·20 claims
- 4261US7856731B2Contact sensing probeRENISHAW PLC·Filed 2007·Granted Dec 28, 2010·3 cites·22 claims
- 4360US7526873B2Use of surface measurement probesRENISHAW PLC·Filed 2005·Granted May 5, 2009·3 cites·27 claims
- 4456US7722515B2Rack and module change systemRENISHAW PLC·Filed 2002·Granted May 25, 2010·16 cites·13 claims
- 4556US2022054967A1Powder bed fusion apparatus and methodsRENISHAW PLC·Filed 2019·Application pending·0 cites
- 4655US2021229215A1Laser beam scannerRENISHAW PLC·Filed 2019·Application pending·0 cites
- 4754US8425119B2Gas bearingsHUNTER STEPHEN PAUL·Filed 2007·Granted Apr 23, 2013·1 cites·14 claims
- 4853US2022134433A1Additive manufactureRENISHAW PLC·Filed 2020·Application pending·0 cites
- 4952US2011016995A1Module or tool changing for metrological probeRENISHAW PLC·Filed 2008·Application pending·0 cites
- 5051US10983504B2Control of a chain of machines, including an additive manufacturing machine, in the manufacture of a workpieceRENISHAW PLC·Filed 2016·Granted Apr 20, 2021·0 cites·17 claims
Showing the top 50 of 65 patent records by PatentIndex Score.
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