Inventor · disambiguated record
Shunsuke Fueki
Also filed as: FUEKI SHUNSUKE
15 granted patents·2 pending applications·529 citations·filing 1990–2006
94Inventor score
Top patents by PatentIndex Score
17 records- 0197US5260579ACharged particle beam exposure system and charged particle beam exposure methodFUJITSU LTD·Filed 1992·Granted Nov 9, 1993·167 cites·33 claims
- 0292US5144142ABlanking aperture array, method for producing blanking aperture array, charged particle beam exposure apparatus and charged particle beam exposure methodFUJITSU LTD·Filed 1990·Granted Sep 1, 1992·78 cites·27 claims
- 0391US5262341ABlanking aperture array and charged particle beam exposure methodFUJITSU LTD·Filed 1992·Granted Nov 16, 1993·66 cites·5 claims
- 0484US5430304ABlanking aperture array type charged particle beam exposureFUJITSU LTD·Filed 1994·Granted Jul 4, 1995·45 cites·11 claims
- 0574US6970690B2Data processing apparatus and card-sized data processing deviceFUJITSU LTD·Filed 2002·Granted Nov 29, 2005·22 cites·8 claims
- 0671US5448075AElectron-beam exposure system having an improved rate of exposure throughputFUJITSU LTD·Filed 1994·Granted Sep 5, 1995·24 cites·10 claims
- 0766US7141939B2Power supply circuit that is stable against sudden load changeFFC LTD·Filed 2004·Granted Nov 28, 2006·15 cites·8 claims
- 0860US6823069B1Encrypting/decrypting system with programmable logic device/unit and method thereofFUJITSU LTD·Filed 1997·Granted Nov 23, 2004·44 cites·29 claims
- 0955US4948983AAlignment of mask and semiconductor wafer using linear fresnel zone plateFUJITSU LTD·Filed 1990·Granted Aug 14, 1990·19 cites·11 claims
- 1051US5175435AElectron beam exposure system with increased efficiency of exposure operationFUJITSU LTD·Filed 1991·Granted Dec 29, 1992·14 cites·11 claims
- 1148US5130547ACharged-particle beam exposure method and apparatusFUJITSU LTD·Filed 1990·Granted Jul 14, 1992·8 cites·14 claims
- 1246US5124560AElectron beam exposure system having an improved data transfer efficiencyFUJITSU LTD·Filed 1991·Granted Jun 23, 1992·8 cites·10 claims
- 1344US4999487AAlignment of mask and semiconductor wafer using linear Fresnel zone plateFUJITSU LTD·Filed 1990·Granted Mar 12, 1991·6 cites·6 claims
- 1444US2002166058A1Semiconductor integrated circuit on IC card protected against tamperingFUJITSU LTD·Filed 2001·Application pending·0 cites
- 1537US2007067375A1Random number generation device and method, generator evaluation method and method for using random numbersFUJITSU LTD·Filed 2006·Application pending·0 cites
- 1636US5500930ASystem to decode instructions indicating the addresses of control codes and providing patterns to direct an electron beam exposure apparatusFUJITSU LTD·Filed 1994·Granted Mar 19, 1996·7 cites·31 claims
- 1733US6009483ASystem for dynamically setting and modifying internal functions externally of a data processing apparatus by storing and restoring a state in progress of internal functions being executedFUJITSU LTD·Filed 1997·Granted Dec 28, 1999·6 cites·24 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →