Inventor · disambiguated record
Kaori Bizen
Also filed as: BIZEN Kaori
6 granted patents·4 citations·filing 2017–2021
68Inventor score
Technology areasH01J
Files withHITACHI HIGH TECH CORP6
Top patents by PatentIndex Score
6 records- 0183US11251018B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2018·Granted Feb 15, 2022·3 cites·13 claims
- 0281US11276554B2Scanning electron microscope and method for measuring patternHITACHI HIGH TECH CORP·Filed 2020·Granted Mar 15, 2022·1 cites·12 claims
- 0361US11610756B2Charged particle beam apparatus and control methodHITACHI HIGH TECH CORP·Filed 2021·Granted Mar 21, 2023·0 cites·12 claims
- 0455US11456150B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Sep 27, 2022·0 cites·5 claims
- 0546US11435178B2Calibration sample, electron beam adjustment method and electron beam apparatus using sameHITACHI HIGH TECH CORP·Filed 2017·Granted Sep 6, 2022·0 cites·15 claims
- 0642US10636618B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Apr 28, 2020·0 cites·15 claims
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