Inventor · disambiguated record
Gianni Stephen Alsasua
Also filed as: ALSASUA GIANNI S · ALSASUA GIANNI STEPHEN
35 granted patents·104 citations·filing 2017–2022
96Inventor score
Files withMICRON TECHNOLOGY INC35
Top patents by PatentIndex Score
35 records- 0199US11282564B1Selective wordline scans based on a data state metricMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 22, 2022·15 cites·20 claims
- 0297US10199111B1Memory devices with read level calibrationMICRON TECHNOLOGY INC·Filed 2017·Granted Feb 5, 2019·30 cites·27 claims
- 0394US11709633B2Adjusting scan event thresholds to mitigate memory errorsMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 25, 2023·2 cites·20 claims
- 0493US11269553B2Adjusting scan event thresholds to mitigate memory errorsMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 8, 2022·3 cites·20 claims
- 0592US10672452B2Temperature informed memory refreshMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 2, 2020·7 cites·24 claims
- 0690US11287998B2Read count scaling factor for data integrity scanMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 29, 2022·5 cites·20 claims
- 0790US11200957B2Read disturb scan consolidationMICRON TECHNOLOGY INC·Filed 2021·Granted Dec 14, 2021·2 cites·20 claims
- 0890US10998034B2Temperature informed memory refreshMICRON TECHNOLOGY INC·Filed 2020·Granted May 4, 2021·2 cites·20 claims
- 0989US11031089B2Block read count voltage adjustmentMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 8, 2021·2 cites·20 claims
- 1089US10950317B2Read disturb scan consolidationMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 16, 2021·4 cites·20 claims
- 1189US10796745B2Temperature informed memory refreshMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 6, 2020·2 cites·20 claims
- 1289US10719271B2Temperature correction in memory sub-systemsMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 21, 2020·4 cites·20 claims
- 1388US10691377B2Adjusting scan event thresholds to mitigate memory errorsMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 23, 2020·6 cites·20 claims
- 1487US11782627B2Read count scaling factor for data integrity scanMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 10, 2023·1 cites·20 claims
- 1584US11335394B2Temperature informed memory refreshMICRON TECHNOLOGY INC·Filed 2021·Granted May 17, 2022·1 cites·20 claims
- 1684US10671298B2Storing page write attributesMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 2, 2020·3 cites·20 claims
- 1784US10366763B2Block read count voltage adjustmentMICRON TECHNOLOGY INC·Filed 2017·Granted Jul 30, 2019·4 cites·17 claims
- 1882US11507300B2Word line group read countersMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 22, 2022·1 cites·20 claims
- 1981US11023177B2Temperature correction in memory sub-systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 1, 2021·1 cites·20 claims
- 2076US10755792B2Block read count voltage adjustmentMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 25, 2020·2 cites·23 claims
- 2175US10573357B2Optimized scan intervalMICRON TECHNOLOGY INC·Filed 2018·Granted Feb 25, 2020·2 cites·20 claims
- 2274US11887651B2Temperature informed memory refreshMICRON TECHNOLOGY INC·Filed 2022·Granted Jan 30, 2024·0 cites·20 claims
- 2373US12009042B2Executing a refresh operation in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 2473US10446197B2Optimized scan intervalMICRON TECHNOLOGY INC·Filed 2017·Granted Oct 15, 2019·2 cites·20 claims
- 2572US11934689B2Word line group read countersMICRON TECHNOLOGY INC·Filed 2022·Granted Mar 19, 2024·0 cites·20 claims
- 2670US11544008B2Temperature correction in memory sub-systemsMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 3, 2023·0 cites·20 claims
- 2770US11456037B2Block read count voltage adjustmentMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 27, 2022·0 cites·21 claims
- 2868US10755793B2SLC page readMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 25, 2020·2 cites·20 claims
- 2966US11521699B2Adjusting a reliability scan threshold in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 6, 2022·0 cites·20 claims
- 3065US11056156B2Optimized scan intervalMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 6, 2021·0 cites·20 claims
- 3164US11682446B2Selective wordline scans based on a data state metricMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 20, 2023·0 cites·20 claims
- 3264US11301146B2Storing page write attributesMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 12, 2022·0 cites·20 claims
- 3363US10510422B2Memory devices with read level calibrationMICRON TECHNOLOGY INC·Filed 2018·Granted Dec 17, 2019·1 cites·24 claims
- 3457US11688473B2SLC page readMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 27, 2023·0 cites·20 claims
- 3539US11126495B2Dynamic error handling in a memory systemMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 21, 2021·0 cites·26 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →