Inventor · disambiguated record
Wataru Yamagishi
Also filed as: YAMAGISHI WATARU
20 granted patents·5 pending applications·403 citations·filing 1979–2025
95Inventor score
Files withFUJITSU LTD11FERROTEC MATERIAL TECH CORPORATION6HITACHI LTD6KODAMA HIROYOSHI1SHOWA DENKO KK1
Top patents by PatentIndex Score
25 records- 0194US6586044B1Method for manufacturing a magnetic hard disk having concentric magnetic tracks with flat surfaceFUJITSU LTD·Filed 2002·Granted Jul 1, 2003·53 cites·5 claims
- 0293US6247348B1Apparatus for and method of testing dynamic characteristics of components of vehicleHITACHI LTD·Filed 1998·Granted Jun 19, 2001·81 cites·10 claims
- 0392US6583957B1Magnetic hard disk having concentric magnetic tracks with flat surface and fabrication method thereofFUJITSU LTD·Filed 1999·Granted Jun 24, 2003·72 cites·15 claims
- 0489US6341258B1Shaking test apparatus and method for structuresHITACHI LTD·Filed 2000·Granted Jan 22, 2002·33 cites·10 claims
- 0583US7768731B2Magnetic recording medium, magnetic storage and method for reproducing information from magnetic recording mediumSHOWA DENKO KK·Filed 2009·Granted Aug 3, 2010·4 cites·19 claims
- 0682US6234011B1Vehicle testing apparatus and method thereofHITACHI LTD·Filed 1998·Granted May 22, 2001·44 cites·12 claims
- 0769US6147488AMeasurement method of time dependent magnetic remanence in a recording mediumFUJITSU LTD·Filed 1998·Granted Nov 14, 2000·21 cites·10 claims
- 0865US8202571B2Manufacturing method for magnetic recording mediumKODAMA HIROYOSHI·Filed 2010·Granted Jun 19, 2012·2 cites·14 claims
- 0962US5287620AProcess of producing multiple-layer glass-ceramic circuit boardFUJITSU LTD·Filed 1992·Granted Feb 22, 1994·30 cites·7 claims
- 1061US2025357180A1Wafer supportFERROTEC MATERIAL TECH CORPORATION·Filed 2025·Application pending·0 cites
- 1159US6773782B2Magnetic memory medium having a magnetic film laminated on a substrate and a non-magnetic film formed thereon, and method of manufacturing the sameFUJITSU LTD·Filed 2001·Granted Aug 10, 2004·7 cites·11 claims
- 1258US2025069942A1Wafer supportFERROTEC MATERIAL TECH CORPORATION·Filed 2024·Application pending·0 cites
- 1357US11485686B2Ceramic, probe guiding member, probe card, and socket for package inspectionFERROTEC MATERIAL TECH CORPORATION·Filed 2018·Granted Nov 1, 2022·0 cites·12 claims
- 1457US6629042B2Testing system and testing method for structureHITACHI LTD·Filed 2002·Granted Sep 30, 2003·6 cites·8 claims
- 1556US11940466B2Ceramic, probe guiding member, probe card, and socket for package inspectionFERROTEC MATERIAL TECH CORPORATION·Filed 2018·Granted Mar 26, 2024·0 cites·20 claims
- 1655US6763311B2Shaking test apparatus and method for structuresHITACHI LTD·Filed 2002·Granted Jul 13, 2004·5 cites·3 claims
- 1755US2024177974A1Wafer supportFERROTEC MATERIAL TECH CORPORATION·Filed 2024·Application pending·0 cites
- 1851US4347201AProcess and apparatus for producing a temperature sensitive elementFUJITSU LTD·Filed 1979·Granted Aug 31, 1982·6 cites·4 claims
- 1951US2007190365A1Magnetic recording medium and manufacturing method thereforFUJITSU LTD·Filed 2006·Application pending·0 cites
- 2050US2023312423A1Ceramic, probe guiding member, probe card and socket for package inspectionFERROTEC MATERIAL TECH CORPORATION·Filed 2021·Application pending·0 cites
- 2145US6397153B1Testing system and testing method for structureHITACHI LTD·Filed 1999·Granted May 28, 2002·10 cites·9 claims
- 2245US4710242AMaterial for temperature sensitive elementsFUJITSU LTD·Filed 1986·Granted Dec 1, 1987·7 cites·5 claims
- 2342US4925502AIron-cobalt type soft magnetic materialFUJITSU LTD·Filed 1988·Granted May 15, 1990·6 cites·3 claims
- 2440US4459248AProcess and apparatus for producing a temperature sensitive elementFUJITSU LTD·Filed 1982·Granted Jul 10, 1984·7 cites·15 claims
- 2539US5676781AMethod of producing a multi-layered ceramic circuit boardFUJITSU LTD·Filed 1995·Granted Oct 14, 1997·9 cites·16 claims
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