Inventor · disambiguated record
Tzong-Kwang Henry Yeh
Also filed as: YEH TZONG-KWANG · YEH TZONG-KWANG HENRY
13 granted patents·2 pending applications·195 citations·filing 1998–2019
91Inventor score
Top patents by PatentIndex Score
15 records- 0189US6069782AESD damage protection using a clamp circuitINTEGRATED DEVICE TECH·Filed 1998·Granted May 30, 2000·85 cites·19 claims
- 0284US7363436B1Collision detection in a multi-port memory systemINTEGRATED DEVICE TECH·Filed 2004·Granted Apr 22, 2008·44 cites·15 claims
- 0375US9857409B2Negative bias thermal instability stress testing of transistorsSYNOPSYS INC·Filed 2014·Granted Jan 2, 2018·3 cites·18 claims
- 0474US6101116ASix transistor content addressable memory cellINTEGRATED DEVICE TECH·Filed 1999·Granted Aug 8, 2000·34 cites·17 claims
- 0573US9817059B2Evaluation of thermal instability stress testingSYNOPSYS INC·Filed 2015·Granted Nov 14, 2017·2 cites·24 claims
- 0668US8892930B2Systems and methods for power management in electronic devicesYEH TZONG-KWANG HENRY·Filed 2008·Granted Nov 18, 2014·6 cites·17 claims
- 0766US7414460B1System and method for integrated circuit charge recyclingINTEGRATED DEVICE TECH·Filed 2006·Granted Aug 19, 2008·7 cites·20 claims
- 0861US10217508B2SRAM and periphery specialized device sensorsSYNOPSYS INC·Filed 2017·Granted Feb 26, 2019·1 cites·21 claims
- 0956US7710789B2Synchronous address and data multiplexed mode for SRAMINTEGRATED DEVICE TECH·Filed 2007·Granted May 4, 2010·4 cites·7 claims
- 1052US7443747B2Memory array bit line coupling capacitor cancellationINTEGRATED DEVICE TECH·Filed 2004·Granted Oct 28, 2008·7 cites·13 claims
- 1149US11164624B2SRAM and periphery specialized device sensorsSYNOPSYS INC·Filed 2019·Granted Nov 2, 2021·0 cites·21 claims
- 1242US7675790B1Over driving pin function selection method and circuitINTEGRATED DEVICE TECH·Filed 2005·Granted Mar 9, 2010·2 cites·8 claims
- 1341US9424951B2Dynamic static random access memory (SRAM) array characterization using an isolated bit-lineSYNOPSYS INC·Filed 2014·Granted Aug 23, 2016·0 cites·19 claims
- 1439US2006101152A1Statistics engineINTEGRATED DEVICE TECH·Filed 2005·Application pending·0 cites
- 1535US2015063010A1Negative bias thermal instability stress testing for static random access memory (sram)SYNOPSYS INC·Filed 2014·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →