Inventor · disambiguated record
Chee Wah Ho
Also filed as: HO CHEE-WAH
25 granted patents·8 pending applications·168 citations·filing 2006–2024
95Inventor score
Top patents by PatentIndex Score
33 records- 0198US10908207B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2016·Granted Feb 2, 2021·31 cites·4 claims
- 0298US10126356B2Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plateESSAI INC·Filed 2016·Granted Nov 13, 2018·30 cites·17 claims
- 0396US11378588B2Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2020·Granted Jul 5, 2022·3 cites·10 claims
- 0495US11835549B2Thermal array with gimbal features and enhanced thermal performanceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 5, 2023·3 cites·20 claims
- 0594US8508245B1Thermal control unit used to maintain the temperature of IC devices under testBARABI NASSER·Filed 2010·Granted Aug 13, 2013·21 cites·11 claims
- 0692US7663388B2Active thermal control unit for maintaining the set point temperature of a DUTESSAI INC·Filed 2008·Granted Feb 16, 2010·26 cites·16 claims
- 0790US12411167B2Tension-based socket gimbal for engaging device under test with thermal arrayADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Sep 9, 2025·1 cites·20 claims
- 0890US9046568B2Universal spring contact pin and IC test socket thereforHO CHEE-WAH·Filed 2010·Granted Jun 2, 2015·15 cites·29 claims
- 0989US10481175B2Contactor with angled depressible probesESSAI INC·Filed 2017·Granted Nov 19, 2019·3 cites·22 claims
- 1087US9804223B2Systems and methods for conforming test tooling to integrated circuit device with heater socketESSAI INC·Filed 2015·Granted Oct 31, 2017·4 cites·19 claims
- 1184US8493085B2Spring contact pin for an ic test socket and the likeBARABI NASSER·Filed 2010·Granted Jul 23, 2013·6 cites·11 claims
- 1281US12210056B2Thermal array with gimbal features and enhanced thermal performanceADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 28, 2025·0 cites·20 claims
- 1381US11293976B1Integrated circuit device test tooling with dual angle cavitiesESSAI INC·Filed 2020·Granted Apr 5, 2022·1 cites·7 claims
- 1480US7651340B2Chip actuator cover assemblyESSAI INC·Filed 2008·Granted Jan 26, 2010·10 cites·29 claims
- 1579US9007080B2Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature controlESSAI INC·Filed 2013·Granted Apr 14, 2015·4 cites·11 claims
- 1676US2024345132A1Hybrid shielding sockets with impedance tuning for integrated circuit device test toolingESSAI INC·Filed 2024·Application pending·0 cites
- 1775US8653842B2Systems and methods for thermal control of integrated circuits during testingBARABI NASSER·Filed 2011·Granted Feb 18, 2014·2 cites·9 claims
- 1873US9383406B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2014·Granted Jul 5, 2016·2 cites·3 claims
- 1972US2022413010A1Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2022·Application pending·0 cites
- 2068US12085587B2Hybrid shielding sockets with impedance tuning for integrated circuit device test toolingESSAI INC·Filed 2021·Granted Sep 10, 2024·0 cites·7 claims
- 2168US9494642B2Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanismsESSAI INC·Filed 2013·Granted Nov 15, 2016·2 cites·8 claims
- 2267US2020225264A1Contactor with angled depressible probesESSAI INC·Filed 2019·Application pending·0 cites
- 2363US7583097B2Contactor nest for an IC device and methodESSAI INC·Filed 2006·Granted Sep 1, 2009·4 cites·21 claims
- 2460US2025237697A1Systems and methods for tool-less, quick change elastomeric contact interfaces for integrated circuit testingESSAI INC·Filed 2024·Application pending·0 cites
- 2558US2025085309A1Low cross-talk interconnection device with impedance-tuned hybrid shielding structures for integrated circuit device test toolingESSAI INC·Filed 2024·Application pending·0 cites
- 2652US9557373B2Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structureESSAI INC·Filed 2014·Granted Jan 31, 2017·0 cites·12 claims
- 2748US11906550B2Probe system for QFP integrated circuit device test toolingESSAI INC·Filed 2021·Granted Feb 20, 2024·0 cites·6 claims
- 2846US9229049B2Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestalsESSAI INC·Filed 2013·Granted Jan 5, 2016·0 cites·12 claims
- 2945US2015022226A1Systems and methods for conforming test tooling to integrated circuit device profiles with coaxial socketESSAI INC·Filed 2014·Application pending·0 cites
- 3043US10094853B2Systems and methods for reliable integrated circuit device test toolingESSAI INC·Filed 2015·Granted Oct 9, 2018·0 cites·14 claims
- 3143US9279852B2Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushingsESSAI INC·Filed 2013·Granted Mar 8, 2016·0 cites·2 claims
- 3241US2020379010A1Systems and methods for high speed test probing of densely packaged semiconductor devicesESSAI INC·Filed 2020·Application pending·0 cites
- 3337US2007018666A1Spring contact pin for an IC chip testerBARABI NASSER·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →