Inventor · disambiguated record
Paul S. Zagar
Also filed as: ZAGAR PAUL · ZAGAR PAUL S
60 granted patents·3,131 citations·filing 1991–1999
99Inventor score
Top patents by PatentIndex Score
60 records- 0198US5526320ABurst EDO memory deviceMICRON TECHNOLOGY INC·Filed 1994·Granted Jun 11, 1996·197 cites·49 claims
- 0296US5901105ADynamic random access memory having decoding circuitry for partial memory blocksFiled 1997·Granted May 4, 1999·169 cites·5 claims
- 0395US5668773ASynchronous burst extended data out DRAMMICRON TECHNOLOGY INC·Filed 1995·Granted Sep 16, 1997·114 cites·2 claims
- 0495US5661695ABurst EDO memory deviceMICRON TECHNOLOGY INC·Filed 1996·Granted Aug 26, 1997·99 cites·9 claims
- 0595US5544124AOptimization circuitry and control for a synchronous memory device with programmable latency periodMICRON TECHNOLOGY INC·Filed 1995·Granted Aug 6, 1996·159 cites·10 claims
- 0695US5235550AMethod for maintaining optimum biasing voltage and standby current levels in a DRAM array having repaired row-to-column shortsMICRON TECHNOLOGY INC·Filed 1991·Granted Aug 10, 1993·115 cites·13 claims
- 0794US5311481AWordline driver circuit having a directly gated pull-down deviceMICRON TECHNOLOGY INC·Filed 1992·Granted May 10, 1994·128 cites·2 claims
- 0894US5148391ANonvolatile, zero-power memory cell constructed with capacitor-like antifuses operable at less than power supply voltageMICRON TECHNOLOGY INC·Filed 1992·Granted Sep 15, 1992·121 cites·31 claims
- 0993US5999480ADynamic random-access memory having a hierarchical data pathMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 7, 1999·128 cites·2 claims
- 1093US5812488ASynchronous burst extended data out dramMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 22, 1998·89 cites·18 claims
- 1193US5675549ABurst EDO memory device address counterMICRON TECHNOLOGY INC·Filed 1995·Granted Oct 7, 1997·120 cites·27 claims
- 1293US5552739AIntegrated circuit power supply having piecewise linearityMICRON TECHNOLOGY INC·Filed 1995·Granted Sep 3, 1996·78 cites·5 claims
- 1393US5528539AHigh speed global row redundancy systemMICRON SEMICONDUCTOR INC·Filed 1994·Granted Jun 18, 1996·126 cites·12 claims
- 1492US5850368ABurst EDO memory address counterMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 15, 1998·99 cites·17 claims
- 1592US5315177AOne time programmable fully-testable programmable logic device with zero power and anti-fuse cell architectureMICRON SEMICONDUCTOR INC·Filed 1993·Granted May 24, 1994·80 cites·12 claims
- 1692US5220215AField programmable logic array with two or planesMICRON TECHNOLOGY INC·Filed 1992·Granted Jun 15, 1993·74 cites·8 claims
- 1789US5761145AEfficient method for obtaining usable parts from a partially good memory integrated circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Jun 2, 1998·58 cites·17 claims
- 1888US5802010ABurst EDO memory deviceMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 1, 1998·87 cites·2 claims
- 1987US5696732ABurst EDO memory deviceMICRON TECHNOLOGY INC·Filed 1996·Granted Dec 9, 1997·87 cites·4 claims
- 2087US5513148ASynchronous NAND DRAM architectureMICRON TECHNOLOGY INC·Filed 1994·Granted Apr 30, 1996·55 cites·16 claims
- 2186US5608668ADram wtih open digit lines and array edge reference sensingMICRON TECHNOLOGY INC·Filed 1995·Granted Mar 4, 1997·49 cites·16 claims
- 2285US5488583AMemory integrated circuits having on-chip topology logic driver, and methods for testing and producing such memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1994·Granted Jan 30, 1996·55 cites·16 claims
- 2383US6104645AHigh speed global row redundancy systemMICRON TECHNOLOGY INC·Filed 1996·Granted Aug 15, 2000·54 cites·22 claims
- 2483US5838620ACircuit for cancelling and replacing redundant elementsMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 17, 1998·41 cites·4 claims
- 2582US5970008AEfficient method for obtaining usable parts from a partially good memory integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 19, 1999·39 cites·12 claims
- 2681US5666323ASynchronous NAND DRAM architectureMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 9, 1997·40 cites·8 claims
- 2780US5844833ADRAM with open digit lines and array edge reference sensingMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 1, 1998·36 cites·15 claims
- 2880US5677884ACircuit for cancelling and replacing redundant elementsMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 14, 1997·35 cites·14 claims
- 2978US5270587ACMOS logic cell for high-speed, zero-power programmable array logic devicesMICRON TECHNOLOGY INC·Filed 1992·Granted Dec 14, 1993·31 cites·25 claims
- 3076US5636172AReduced pitch laser redundancy fuse bank structureMICRON TECHNOLOGY INC·Filed 1995·Granted Jun 3, 1997·47 cites·6 claims
- 3174US6097647AEfficient method for obtaining usable parts from a partially good memory integrated circuitMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 1, 2000·25 cites·16 claims
- 3273US6208568B1Circuit for cancelling and replacing redundant elementsMICRON TECHNOLOGY INC·Filed 1998·Granted Mar 27, 2001·24 cites·13 claims
- 3372US5747869AReduced pitch laser redundancy fuse bank structureMICRON TECHNOLOGY INC·Filed 1997·Granted May 5, 1998·39 cites·11 claims
- 3472US5311478AIntegrated circuit memory with asymmetric row access topologyMICRON TECHNOLOGY INC·Filed 1992·Granted May 10, 1994·33 cites·24 claims
- 3572US5235221AField programmable logic array with speed optimized architectureMICRON TECHNOLOGY INC·Filed 1992·Granted Aug 10, 1993·27 cites·20 claims
- 3671US5774412ALocal word line phase driverMICRON TECHNOLOGY INC·Filed 1996·Granted Jun 30, 1998·26 cites·9 claims
- 3771US5384500AProgrammable logic device macrocell with an exclusive feedback and an exclusive external input line for a combinatorial mode and accommodating two separate programmable or planesMICRON SEMICONDUCTOR INC·Filed 1993·Granted Jan 24, 1995·24 cites·2 claims
- 3869US5912579ACircuit for cancelling and replacing redundant elementsFiled 1998·Granted Jun 15, 1999·29 cites·14 claims
- 3968US5831918ACircuit and method for varying a period of an internal control signal during a test modeMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 3, 1998·22 cites·18 claims
- 4066USRE36952EOne time programmable fully-testable programmable logic device with zero power and anti-fuse cell architectureMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 14, 2000·25 cites·1 claims
- 4166US5991214ACircuit and method for varying a period of an internal control signal during a test modeMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 23, 1999·24 cites·18 claims
- 4264USRE35825EMethod for maintaining optimum biasing voltage and standby current levels in a DRAM array having repaired row-to-column shortsMICRON TECHNOLOGY INC·Filed 1995·Granted Jun 16, 1998·20 cites·14 claims
- 4362US5293342AWordline driver circuit having an automatic precharge circuitCASPER STEPHEN L·Filed 1992·Granted Mar 8, 1994·22 cites·8 claims
- 4461US5287017AProgrammable logic device macrocell with two OR array inputsMICRON TECHNOLOGY INC·Filed 1992·Granted Feb 15, 1994·17 cites·11 claims
- 4560US6201740B1Cache memories using DRAM cells with high-speed data pathMICRON TECHNOLOGY INC·Filed 1999·Granted Mar 13, 2001·14 cites·42 claims
- 4659US5586080ALocal word line phase driverMICRON TECHNOLOGY INC·Filed 1995·Granted Dec 17, 1996·15 cites·9 claims
- 4757US5726931ADRAM with open digit lines and array edge reference sensingMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 10, 1998·13 cites·15 claims
- 4857US5465232ASense circuit for tracking charge transfer through access transistors in a dynamic random access memoryMICRON SEMICONDUCTOR INC·Filed 1994·Granted Nov 7, 1995·17 cites·13 claims
- 4954US5801996AData path for high speed high bandwidth DRAMMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 1, 1998·11 cites·18 claims
- 5054US5325331AImproved device for sensing information store in a dynamic memoryMICRON TECHNOLOGY INC·Filed 1991·Granted Jun 28, 1994·16 cites·17 claims
Showing the top 50 of 60 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →