Inventor · disambiguated record
Raymond W. Jeffer
Also filed as: JEFFER RAYMOND W · JEFFER RAYMOND WALTER
5 granted patents·29 citations·filing 2003–2016
73Inventor score
Files withIBM5
Top patents by PatentIndex Score
5 records- 0178US7198276B2Adaptive electrostatic pin chuckIBM·Filed 2003·Granted Apr 3, 2007·25 cites·28 claims
- 0273US7496885B1Method of compensating for defective pattern generation data in a variable shaped electron beam systemIBM·Filed 2008·Granted Feb 24, 2009·4 cites·1 claims
- 0357US9372394B2Test pattern layout for test photomask and method for evaluating critical dimension changesIBM·Filed 2014·Granted Jun 21, 2016·0 cites·14 claims
- 0455US9996000B2Test pattern layout for test photomask and method for evaluating critical dimension changesIBM·Filed 2016·Granted Jun 12, 2018·0 cites·17 claims
- 0555US9989843B2Test pattern layout for test photomask and method for evaluating critical dimension changesIBM·Filed 2016·Granted Jun 5, 2018·0 cites·6 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →