Inventor · disambiguated record

Pawel Janus

Also filed as: JANUS PAWEL

1 granted patent·14 citations·filing 2008–2008

36Inventor score

Technology areasG01Q

Files withHECKER MICHAEL1

Top patents by PatentIndex Score

1 record

0180US8056402B2Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniquesHECKER MICHAEL·Filed 2008·Granted Nov 15, 2011·14 cites·8 claims

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