Inventor · disambiguated record

Wen-Dar Hsieh

Also filed as: HSIEH WEN-DAR

1 granted patent·8 citations·filing 2012–2012

30Inventor score

Technology areasG11C

Files withIND TECH RES INST1

Top patents by PatentIndex Score

1 record

0177US8867289B2Chip with embedded non-volatile memory and testing method thereforIND TECH RES INST·Filed 2012·Granted Oct 21, 2014·8 cites·18 claims

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