Inventor · disambiguated record

Bing Huei Perng

Also filed as: PERNG BING HUEI

1 granted patent·34 citations·filing 2002–2002

46Inventor score

Technology areasG01B

Files withTAIWAN SEMICONDUCTOR MFG1

Top patents by PatentIndex Score

1 record

0179US6646752B2Method and apparatus for measuring thickness of a thin oxide layerTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Nov 11, 2003·34 cites·20 claims

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