Inventor · disambiguated record

Takahiro Ooyama

Also filed as: OOYAMA TAKAHIRO

1 granted patent·1 citations·filing 2012–2012

16Inventor score

Technology areasG01R

Files withFUJI ELECTRIC CO LTD1

Top patents by PatentIndex Score

1 record

0158US9222970B2Fault position analysis method and fault position analysis device for semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2012·Granted Dec 29, 2015·1 cites·16 claims

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