Inventor · disambiguated record
Yukiharu Uraoka
Also filed as: URAOKA YUKIHARU
10 granted patents·3 pending applications·452 citations·filing 1992–2020
90Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD6AJINOMOTO KK2MERCK PATENT GMBH2NAT UNIV CORP NARA INST1NATIONAL UNIV CORPORATION NARA INSTITUTE OF SCIENCE AND TECHNOLOGY1
Top patents by PatentIndex Score
13 records- 0197US5945834ASemiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Aug 31, 1999·160 cites·7 claims
- 0296US6005401ASemiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Dec 21, 1999·140 cites·8 claims
- 0380US6323663B1Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Nov 27, 2001·37 cites·7 claims
- 0478US5650336AMethod of presuming life time of semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Jul 22, 1997·59 cites·15 claims
- 0576US10916661B2Thin film transistor substrate provided with protective film and method for producing sameMERCK PATENT GMBH·Filed 2017·Granted Feb 9, 2021·2 cites·15 claims
- 0672US5598100ADevice for and method of evaluating semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Jan 28, 1997·30 cites·7 claims
- 0768US5504431ADevice for and method of evaluating semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted Apr 2, 1996·24 cites·3 claims
- 0847US9187570B2Fusion proteinAJINOMOTO KK·Filed 2013·Granted Nov 17, 2015·0 cites·13 claims
- 0946US2014150855A1Porous structure body and method for producing the sameAJINOMOTO KK·Filed 2014·Application pending·0 cites
- 1045US2022267639A1Gate insulating film forming compositionMERCK PATENT GMBH·Filed 2020·Application pending·0 cites
- 1143US7901978B2Method of fabricating thin-film transistorNAT UNIV CORP NARA INST·Filed 2006·Granted Mar 8, 2011·0 cites·5 claims
- 1241US2012267258A1Method for electrochemically detecting analyteURAOKA YUKIHARU·Filed 2012·Application pending·0 cites
- 1340US10475934B2Thin film transistor, method for manufacturing same and semiconductor device comprising said thin film transistorNATIONAL UNIV CORPORATION NARA INSTITUTE OF SCIENCE AND TECHNOLOGY·Filed 2016·Granted Nov 12, 2019·0 cites·11 claims
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