Inventor · disambiguated record

Yuval Dorphan

Also filed as: DORPHAN YUVAL

1 granted patent·15 citations·filing 2005–2005

36Inventor score

Technology areasG01N

Files withAPPLIED MATERIALS SOUTH EAST A1

Top patents by PatentIndex Score

1 record

0186US7804993B2Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all imagesAPPLIED MATERIALS SOUTH EAST A·Filed 2005·Granted Sep 28, 2010·15 cites·8 claims

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