Inventor · disambiguated record

Hyun-Joo Baik

Also filed as: BAIK HYUN-JOO

1 granted patent·10 citations·filing 2008–2008

33Inventor score

Technology areasG03F

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0181US7865866B2Method of inspecting mask using aerial image inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jan 4, 2011·10 cites·20 claims

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