Inventor · disambiguated record
Yasushi Goto
Also filed as: GOTO YASUSHI
55 granted patents·11 pending applications·1,154 citations·filing 1989–2018
98Inventor score
Files withHITACHI LTD30RENESAS TECH CORP8TOSHIBA KK6HITACHI CHEMICAL CO LTD5MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4
Top patents by PatentIndex Score
66 records- 0198US5001542AComposition for circuit connection, method for connection using the same, and connected structure of semiconductor chipsHITACHI CHEMICAL CO LTD·Filed 1989·Granted Mar 19, 1991·200 cites·14 claims
- 0297US5120665AMethod of using an anisotropically electroconductive adhesive having pressure-deformable electroconductive particles to electrically connect circuitsHITACHI CHEMICAL CO LTD·Filed 1991·Granted Jun 9, 1992·180 cites·12 claims
- 0396US5843251AProcess for connecting circuits and adhesive film used thereforHITACHI CHEMICAL CO LTD·Filed 1992·Granted Dec 1, 1998·106 cites·9 claims
- 0495US7355270B2Semiconductor chip with coil antenna and communication systemHITACHI LTD·Filed 2005·Granted Apr 8, 2008·51 cites·6 claims
- 0593US7045843B2Semiconductor device using MEMS switchHITACHI LTD·Filed 2004·Granted May 16, 2006·50 cites·16 claims
- 0692US6113728AProcess for connecting circuits and adhesive film used thereforHITACHI CHEMICAL CO LTD·Filed 1995·Granted Sep 5, 2000·82 cites·3 claims
- 0791US8144322B2Spectral characteristic measuring apparatus, method for calibrating spectral characteristic measuring apparatus, and spectral characteristic measuring systemNAGASHIMA YOSHIYUKI·Filed 2009·Granted Mar 27, 2012·31 cites·7 claims
- 0889US6042894AAnisotropically electroconductive resin filmHITACHI CHEMICAL CO LTD·Filed 1997·Granted Mar 28, 2000·110 cites·15 claims
- 0987US7451656B2Semiconductor device embedded with pressure sensor and manufacturing method thereofHITACHI LTD·Filed 2007·Granted Nov 18, 2008·13 cites·9 claims
- 1087US7270012B2Semiconductor device embedded with pressure sensor and manufacturing method thereofHITACHI LTD·Filed 2005·Granted Sep 18, 2007·13 cites·8 claims
- 1183US7919814B2Semiconductor device with integrated circuit electrically connected to a MEMS sensor by a through-electrodeHITACHI LTD·Filed 2008·Granted Apr 5, 2011·12 cites·10 claims
- 1283US7345590B2Wireless terminal with gas leakage detection function, gas leakage detection system using the same, and gas leakage notification methodHITACHI LTD·Filed 2005·Granted Mar 18, 2008·19 cites·7 claims
- 1383US7242309B2Gas detection systemHITACHI LTD·Filed 2005·Granted Jul 10, 2007·9 cites·5 claims
- 1482US7667559B2Switch, semiconductor device, and manufacturing method thereofHITACHI LTD·Filed 2006·Granted Feb 23, 2010·9 cites·12 claims
- 1580US6677244B2Specimen surface processing methodHITACHI LTD·Filed 2002·Granted Jan 13, 2004·18 cites·4 claims
- 1679US7250863B2Transponder and a sensing system using the transponderHITACHI LTD·Filed 2005·Granted Jul 31, 2007·10 cites·7 claims
- 1779US5658811AMethod of manufacturing a semiconductor deviceHITACHI LTD·Filed 1995·Granted Aug 19, 1997·45 cites·31 claims
- 1878US8427177B2Capacitance sensorJEONG HEEWON·Filed 2010·Granted Apr 23, 2013·4 cites·21 claims
- 1977US7306941B2Biochemical measuring chip and measuring apparatusHITACHI LTD·Filed 2004·Granted Dec 11, 2007·13 cites·14 claims
- 2076US7735967B2Actuator for manipulation of liquid dropletsHITACHI LTD·Filed 2007·Granted Jun 15, 2010·5 cites·14 claims
- 2173US6717766B2Automatic changer for cartridge-type recording mediumFUJITSU LTD·Filed 2002·Granted Apr 6, 2004·11 cites·11 claims
- 2273US6710383B2MISFET semiconductor device having a high dielectric constant insulating film with tapered end portionsRENESAS TECH CORP·Filed 2001·Granted Mar 23, 2004·13 cites·23 claims
- 2371US9395227B2Reactor water-level measurement systemTOSHIBA KK·Filed 2012·Granted Jul 19, 2016·1 cites·9 claims
- 2471US7972886B2Method of manufacturing micro electro mechanical systems deviceHITACHI LTD·Filed 2008·Granted Jul 5, 2011·7 cites·5 claims
- 2571US7567019B2Actuator systemHITACHI LTD·Filed 2007·Granted Jul 28, 2009·6 cites·8 claims
- 2671US6797566B1Semiconductor integrated circuit device and process for producing the sameRENESAS TECH CORP·Filed 2000·Granted Sep 28, 2004·13 cites·13 claims
- 2767US6660647B1Method for processing surface of sampleHITACHI LTD·Filed 1999·Granted Dec 9, 2003·28 cites·14 claims
- 2866US8429969B2Inertial sensor and method of manufacturing the sameYAMANAKA KIYOKO·Filed 2009·Granted Apr 30, 2013·4 cites·14 claims
- 2965US7311881B2Chips, and apparatus and method for reaction analysisHITACHI LTD·Filed 2004·Granted Dec 25, 2007·8 cites·9 claims
- 3064US9681012B2Colour measurement device and colour measurement methodKONICA MINOLTA INC·Filed 2015·Granted Jun 13, 2017·1 cites·9 claims
- 3164US7199022B2Manufacturing method of semiconductor deviceRENESAS TECH CORP·Filed 2004·Granted Apr 3, 2007·18 cites·8 claims
- 3263US7770451B2Angular velocity detecting deviceHITACHI LTD·Filed 2008·Granted Aug 10, 2010·2 cites·10 claims
- 3362US6714293B2Exposure meterMINOLTA CO LTD·Filed 2001·Granted Mar 30, 2004·8 cites·20 claims
- 3460US9590451B2Autonomous power supply systemHITACHI LTD·Filed 2014·Granted Mar 7, 2017·1 cites·8 claims
- 3559US5815063APositive temperature coefficient thermistor and fabrication method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Sep 29, 1998·18 cites·6 claims
- 3657US8616058B2Angular velocity detecting deviceHITACHI LTD·Filed 2012·Granted Dec 31, 2013·0 cites·7 claims
- 3757US7323073B2Piezoelectric porcelain composition, laminated piezoelectric device therefrom and process for producing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Jan 29, 2008·4 cites·9 claims
- 3856US6456681B1Neutron flux measuring apparatusTOSHIBA KK·Filed 1999·Granted Sep 24, 2002·13 cites·20 claims
- 3954US9366687B2Angular velocity detecting deviceHITACHI LTD·Filed 2013·Granted Jun 14, 2016·0 cites·7 claims
- 4053US7105409B2Semiconductor integrated circuit device and process for producing the sameRENESAS TECH CORP·Filed 2004·Granted Sep 12, 2006·4 cites·4 claims
- 4152US6448698B1Laminated piezoelectric transformerMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Sep 10, 2002·4 cites·32 claims
- 4250US7259104B2Sample surface processing methodHITACHI LTD·Filed 2003·Granted Aug 21, 2007·2 cites·7 claims
- 4349US7193281B2Semiconductor device and process for producing the sameRENESAS TECH CORP·Filed 2005·Granted Mar 20, 2007·0 cites·7 claims
- 4449US2007165512A1Information Processing ApparatusHITACHI LTD·Filed 2006·Application pending·0 cites
- 4549US2014355730A1Reactor oscillation power range monitor, reactor oscillation power range monitoring method, and recording medium containing reactor oscillation power range monitoring programTOSHIBA KK·Filed 2014·Application pending·0 cites
- 4648US8327706B2Angular velocity detecting deviceJEONG HEEWON·Filed 2010·Granted Dec 11, 2012·0 cites·4 claims
- 4748US8044703B2Diversity signal processing system and a producing method thereofTOSHIBA KK·Filed 2008·Granted Oct 25, 2011·0 cites·11 claims
- 4848US6833296B2Method of making a MISFET semiconductor device having a high dielectric constant insulating film with tapered end portionsRENESAS TECH CORP·Filed 2004·Granted Dec 21, 2004·2 cites·12 claims
- 4948US2007278098A1Gas sensor and gas detection system using the sameHITACHI LTD·Filed 2007·Application pending·0 cites
- 5047US2006275986A1Semiconductor intergrated circuit device and process for producing the sameRENESAS TECH CORP·Filed 2006·Application pending·0 cites
Showing the top 50 of 66 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →