Inventor · disambiguated record
Brian K. Cusson
Also filed as: CUSSON BRIAN K
15 granted patents·1 pending application·375 citations·filing 1999–2003
94Inventor score
Files withADVANCED MICRO DEVICES INC15
Top patents by PatentIndex Score
16 records- 0191US6766214B1Adjusting a sampling rate based on state estimation resultsADVANCED MICRO DEVICES INC·Filed 2003·Granted Jul 20, 2004·69 cites·28 claims
- 0289US6778873B1Identifying a cause of a fault based on a process controller outputADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 17, 2004·56 cites·27 claims
- 0388US6953697B1Advanced process control of the manufacture of an oxide-nitride-oxide stack of a memory device, and system for accomplishing sameADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 11, 2005·46 cites·50 claims
- 0482US6740534B1Determination of a process flow based upon fault detection analysisADVANCED MICRO DEVICES INC·Filed 2002·Granted May 25, 2004·34 cites·16 claims
- 0575US7031793B1Conflict resolution among multiple controllersADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 18, 2006·20 cites·24 claims
- 0671US7246290B1Determining the health of a desired node in a multi-level systemADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 17, 2007·16 cites·27 claims
- 0771US6834211B1Adjusting a trace data rate based upon a tool stateADVANCED MICRO DEVICES INC·Filed 2002·Granted Dec 21, 2004·15 cites·32 claims
- 0868US6925347B1Process control based on an estimated process resultADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 2, 2005·13 cites·29 claims
- 0968US6800562B1Method of controlling wafer charging effects due to manufacturing processesADVANCED MICRO DEVICES INC·Filed 2003·Granted Oct 5, 2004·11 cites·37 claims
- 1067US6991945B1Fault detection spanning multiple processesADVANCED MICRO DEVICES INC·Filed 2002·Granted Jan 31, 2006·11 cites·21 claims
- 1163US6985825B1Method and apparatus for adaptive sampling based on process covarianceADVANCED MICRO DEVICES INC·Filed 2003·Granted Jan 10, 2006·9 cites·21 claims
- 1258US6446022B1Wafer fabrication system providing measurement data screeningADVANCED MICRO DEVICES INC·Filed 1999·Granted Sep 3, 2002·24 cites·19 claims
- 1357US6424876B1Statistical process control system with normalized control chartingADVANCED MICRO DEVICES INC·Filed 1999·Granted Jul 23, 2002·43 cites·42 claims
- 1456US7117062B1Determining transmission of error effects for improving parametric performanceADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 3, 2006·5 cites·33 claims
- 1552US7581140B1Initiating test runs based on fault detection resultsADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 25, 2009·3 cites·19 claims
- 1635US2005021272A1Method and apparatus for performing metrology dispatching based upon fault detectionFiled 2003·Application pending·0 cites
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