Inventor · disambiguated record
Nobuaki Ueki
Also filed as: UEKI NOBUAKI
42 granted patents·10 pending applications·546 citations·filing 1992–2018
98Inventor score
Top patents by PatentIndex Score
52 records- 0197US6529541B1Surface emitting semiconductor laserFUJI XEROX CO LTD·Filed 2000·Granted Mar 4, 2003·79 cites·21 claims
- 0293US6816527B2Surface emitting semiconductor laserFUJI XEROX CO LTD·Filed 2003·Granted Nov 9, 2004·43 cites·20 claims
- 0391US6320893B1Surface emitting semiconductor laserFUJI XEROX CO LTD·Filed 1998·Granted Nov 20, 2001·97 cites·21 claims
- 0489US6650683B2Surface emitting semiconductor laserFUJI XEROX CO LTD·Filed 2002·Granted Nov 18, 2003·30 cites·9 claims
- 0584US7580133B2Interferometric apparatus for measuring moving object and optical interferometry method for measuring moving objectFUJINON CORP·Filed 2006·Granted Aug 25, 2009·9 cites·14 claims
- 0682US7760365B2Aspheric lens surface-decenter measuring method and apparatusFUJINON CORP·Filed 2008·Granted Jul 20, 2010·7 cites·16 claims
- 0782US7346089B2Surface-emitting laser diode with tunnel junction and fabrication method thereofFUJI XEROX CO LTD·Filed 2005·Granted Mar 18, 2008·7 cites·14 claims
- 0880US6483860B1Surface emitting semiconductor laser with oxidized post structureFUJI XEROX CO LTD·Filed 2000·Granted Nov 19, 2002·16 cites·9 claims
- 0979US6990128B2Surface emitting semiconductor laser and manufacturing method thereofFUMIO KOYAMA·Filed 2001·Granted Jan 24, 2006·16 cites·23 claims
- 1076US6992779B2Interferometer apparatus for both low and high coherence measurement and method thereofFUJINON CORP·Filed 2003·Granted Jan 31, 2006·20 cites·13 claims
- 1173US7957447B2VCSEL array device and method for manufacturing the VCSEL array deviceFUJI XEROX CO LTD·Filed 2008·Granted Jun 7, 2011·4 cites·11 claims
- 1273US7496123B2VCSEL with improved high frequency characteristics, semiconductor laser device, module, and optical transmission deviceFUJI XEROX CO LTD·Filed 2007·Granted Feb 24, 2009·4 cites·16 claims
- 1372US7366218B2Vertical cavity surface emitting laser diode and process for producing the sameFUJI XEROX CO LTD·Filed 2005·Granted Apr 29, 2008·4 cites·11 claims
- 1470US7352787B2Vertical cavity surface emitting laser diode and process for producing the sameFUJI XEROX CO LTD·Filed 2004·Granted Apr 1, 2008·10 cites·15 claims
- 1569US10437028B2Lens device, camera system, and aberration correction unitFUJIFILM CORP·Filed 2018·Granted Oct 8, 2019·1 cites·9 claims
- 1669US8526009B2Apparatus for measuring rotationally symmetric aspheric surfaceUEKI NOBUAKI·Filed 2011·Granted Sep 3, 2013·4 cites·6 claims
- 1769US7443899B2Surface emitting semiconductor laser diode and manufacturing method thereofFUJI XEROX CO LTD·Filed 2004·Granted Oct 28, 2008·8 cites·13 claims
- 1869US7233400B2Interferometer for measuring virtual contact surfacesFUJINON CORP·Filed 2005·Granted Jun 19, 2007·6 cites·5 claims
- 1968US7340962B2Method and device for holding subject and measuring instrument equipped with the deviceFUJINON CORP·Filed 2005·Granted Mar 11, 2008·2 cites·10 claims
- 2068US5809052ASemiconductor laser array driving method, semiconductor laser array driving device and image forming apparatusFUJI XEROX CO LTD·Filed 1996·Granted Sep 15, 1998·30 cites·11 claims
- 2164US7141441B2Surface emitting semiconductor laser and manufacturing method thereofFUMIO KOYAMA C O TOKYO INST OF·Filed 2004·Granted Nov 28, 2006·7 cites·10 claims
- 2263US7058104B2Surface emitting semiconductor laser and method of fabricating the sameFUJI XEROX CO LTD·Filed 2003·Granted Jun 6, 2006·6 cites·15 claims
- 2359US5880766AApparatus for correcting positional deviation of light source emitting light beams in image recording apparatusFUJI XEROX CO LTD·Filed 1996·Granted Mar 9, 1999·23 cites·18 claims
- 2455US6018990AFlatness measuring and analyzing methodFUJI PHOTO OPTICAL CO LTD·Filed 1998·Granted Feb 1, 2000·19 cites·4 claims
- 2554US6912055B2Spherical form measuring and analyzing methodFUJINON CORP·Filed 2003·Granted Jun 28, 2005·6 cites·6 claims
- 2651US5963242AImage recording apparatus with an array light sourceFUJI XEROX CO LTD·Filed 1996·Granted Oct 5, 1999·12 cites·14 claims
- 2750US7375825B2Light intensity ratio adjustment filter for an interferometer, interferometer, and light interference measurement methodFUJINON CORP·Filed 2005·Granted May 20, 2008·1 cites·11 claims
- 2850US7342666B2Method and apparatus for measuring holding distortionFUJINON CORP·Filed 2005·Granted Mar 11, 2008·1 cites·6 claims
- 2950US7336688B2Surface emitting semiconductor laser and method of manufacturing the sameFUJI XEROX CO LTD·Filed 2003·Granted Feb 26, 2008·2 cites·4 claims
- 3049US2009209871A1Apparatus for measuring blood flow rate and method for measuring blood flow rateFUJI XEROX CO LTD·Filed 2008·Application pending·0 cites
- 3147US5990494AOptoelectro transducer array, and light-emitting device array and fabrication process thereofFUJI XEROX CO LTD·Filed 1997·Granted Nov 23, 1999·10 cites·6 claims
- 3247US5563901ASemiconductor laser arrayFUJI XEROX CO LTD·Filed 1995·Granted Oct 8, 1996·13 cites·14 claims
- 3347US5253265ASemiconductor laser deviceFUJI XEROX CO LTD·Filed 1992·Granted Oct 12, 1993·11 cites·8 claims
- 3444US6867871B2Moiré grating noise eliminating methodFUJI PHOTO OPTICAL CO LTD·Filed 2003·Granted Mar 15, 2005·2 cites·8 claims
- 3543US7672352B2Surface-emitting semiconductor array device, module, light source device, data processing apparatus, light transmitting device, light spatial transmitting apparatus, and light spatial transmitting systemFUJI XEROX CO LTD·Filed 2007·Granted Mar 2, 2010·0 cites·17 claims
- 3643US5533042ASemiconductor laser device and driving method for the same as well as tracking servo system employing the sameFUJI XEROX CO LTD·Filed 1994·Granted Jul 2, 1996·8 cites·16 claims
- 3743US2005036152A1Vibration-resistant interferometer apparatusFUJI PHOTO OPTICAL CO LTD·Filed 2004·Application pending·0 cites
- 3843US2007147459A1Optical data processing apparatus using vertical-cavity surface-emitting laser (VCSEL) device with large oxide-apertureFUJI XEROX CO LTD·Filed 2006·Application pending·0 cites
- 3942US2006285566A1Surface-emitting laser diode with tunnel junction and fabrication methodFUJI XEROX CO LTD·Filed 2005·Application pending·0 cites
- 4041US6636542B1Surface emitting semiconductor laser, surface emitting semiconductor laser array, and method for manufacturing surface emitting semiconductor laserFUJI XEROX CO LTD·Filed 1999·Granted Oct 21, 2003·9 cites·12 claims
- 4141US5588016ASemiconductor laser deviceFUJI XEROX CO LTD·Filed 1995·Granted Dec 24, 1996·8 cites·16 claims
- 4240US2003235226A1Surface emitting semiconductor laser and method of fabricating the sameFUJI XEROX CO LTD·Filed 2003·Application pending·0 cites
- 4338US2005111507A1Surface-emitting semiconductor laser and method of fabricating the sameFUMIO KOYAMA·Filed 2004·Application pending·0 cites
- 4437US2011042591A1Method and device for reading reproduced imageKUROSE MINORU·Filed 2010·Application pending·0 cites
- 4536US6744523B2Imaging optical system for oblique incidence interferometerFUJI PHOTO OPTICAL CO LTD·Filed 2002·Granted Jun 1, 2004·0 cites·6 claims
- 4635US6985605B2Phase unwrapping method for fringe image analysisFUJINON CORP·Filed 2002·Granted Jan 10, 2006·2 cites·4 claims
- 4735US2011299090A1Real-time interferometerUEKI NOBUAKI·Filed 2011·Application pending·0 cites
- 4835US2011305254A1Optical transmission deviceUEKI NOBUAKI·Filed 2010·Application pending·0 cites
- 4934US5491709ASemiconductor laser deviceFUJI XEROX CO LTD·Filed 1993·Granted Feb 13, 1996·3 cites·18 claims
- 5034US2011304855A1Apparatus for measuring surface misalignment and angular misalignmentUEKI NOBUAKI·Filed 2011·Application pending·0 cites
Showing the top 50 of 52 patent records by PatentIndex Score.
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