Inventor · disambiguated record
Shunsuke Endou
Also filed as: ENDOU SHUNSUKE
1 granted patent·1 pending application·34 citations·filing 2001–2002
45Inventor score
Technology areasG11C
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2 records- 0179US7017090B2Semiconductor module including semiconductor memory device shiftable to test mode as well as semiconductor memory device used thereinRENESAS TECH CORP·Filed 2002·Granted Mar 21, 2006·34 cites·17 claims
- 0220US2003009713A1Semiconductor device capable of easily setting test mode during test conducted by applying high voltageMITSUBISHI ELECTRIC CORP·Filed 2001·Application pending·0 cites
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