Inventor · disambiguated record

Chunlin Luke Zeng

Also filed as: ZENG CHUNLIN LUKE

1 granted patent·2 citations·filing 2007–2007

18Inventor score

Technology areasG01N

Files withAMANULLAH AJHARALI1

Top patents by PatentIndex Score

1 record

0159US8401272B2Patterned wafer defect inspection system and methodAMANULLAH AJHARALI·Filed 2007·Granted Mar 19, 2013·2 cites·21 claims

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