Inventor · disambiguated record

Young-Gil Bae

Also filed as: BAE YOUNG-GIL

1 granted patent·4 citations·filing 2006–2006

25Inventor score

Technology areasH10P

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0168US7456641B2Probe card that controls a temperature of a probe needle, test apparatus having the probe card, and test method using the test apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 25, 2008·4 cites·28 claims

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