Inventor · disambiguated record
Toshihiko Himeno
Also filed as: HIMENO TOSHIHIKO
20 granted patents·3 pending applications·877 citations·filing 1995–2010
96Inventor score
Top patents by PatentIndex Score
23 records- 0197US6462985B2Non-volatile semiconductor memory for storing initially-setting dataTOSHIBA KK·Filed 2000·Granted Oct 8, 2002·109 cites·34 claims
- 0296US6097638ASemiconductor memory deviceTOSHIBA KK·Filed 1998·Granted Aug 1, 2000·188 cites·61 claims
- 0395US6646930B2Non-volatile semiconductor memoryTOSHIBA KK·Filed 2001·Granted Nov 11, 2003·78 cites·35 claims
- 0494US6643180B2Semiconductor memory device with test modeTOSHIBA KK·Filed 2001·Granted Nov 4, 2003·80 cites·7 claims
- 0594US5761125ACell threshold value distribution detection circuit and method of detecting cell threshold valueTOSHIBA KK·Filed 1995·Granted Jun 2, 1998·126 cites·28 claims
- 0692US7313022B2Non-volatile semiconductor memoryTOSHIBA KK·Filed 2005·Granted Dec 25, 2007·23 cites·18 claims
- 0790US6704223B2Non-volatile semiconductor memoryTOSHIBA KK·Filed 2002·Granted Mar 9, 2004·37 cites·34 claims
- 0889US6819596B2Semiconductor memory device with test modeTOKYO SHIBAURA ELECTRIC CO·Filed 2003·Granted Nov 16, 2004·45 cites·5 claims
- 0987US6831859B2Non-volatile semiconductor memory for storing initially-setting dataTOSHIBA KK·Filed 2003·Granted Dec 14, 2004·31 cites·8 claims
- 1078US7619921B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2006·Granted Nov 17, 2009·7 cites·4 claims
- 1177US5818756ANon-volatile semiconductor memory device with block erase functionTOSHIBA KK·Filed 1996·Granted Oct 6, 1998·36 cites·6 claims
- 1276US6970388B2Non-volatile semiconductor memoryTOSHIBA KK·Filed 2003·Granted Nov 29, 2005·17 cites·35 claims
- 1375US7126851B2Method of transferring initially-setting data in a non-volatile semiconductor memoryTOSHIBA KK·Filed 2004·Granted Oct 24, 2006·14 cites·8 claims
- 1470US7685552B2Semiconductor integrated circuit device having clock buffers and method for arranging the clock buffers on the deviceTOSHIBA KK·Filed 2007·Granted Mar 23, 2010·6 cites·3 claims
- 1567US5650961ACell characteristic measuring circuit for a nonvolatile semiconductor memory device and cell characteristic measuring methodTOSHIBA KK·Filed 1995·Granted Jul 22, 1997·28 cites·20 claims
- 1659US6324114B1Semiconductor memory device using a plurality of semiconductor memory chips mounted in one system and a semiconductor memory system using a plurality of semiconductor memory devicesTOSHIBA KK·Filed 1998·Granted Nov 27, 2001·35 cites·72 claims
- 1757US6240022B1Non-volatile semiconductor memory device with block erase functionTOSHIBA KK·Filed 1998·Granted May 29, 2001·15 cites·30 claims
- 1854US2009126024A1Method and system for managing software licenses and storage apparatusTOSHIBA KK·Filed 2009·Application pending·0 cites
- 1952US7826268B2Nonvolatile semiconductor memoryTOSHIBA KK·Filed 2008·Granted Nov 2, 2010·2 cites·13 claims
- 2044US2002138754A1Method and system for managing software licenses and storage apparatusTOSHIBA KK·Filed 2002·Application pending·0 cites
- 2140US7262636B2Method and system for a circuit for timing sensitive applicationsTOSHIBA KK·Filed 2005·Granted Aug 28, 2007·0 cites·15 claims
- 2238US7421609B2Method, system and apparatus for producing a clock with desired frequency characteristicsTOSHIBA KK·Filed 2005·Granted Sep 2, 2008·0 cites·39 claims
- 2333US2010318729A1Nonvolatile semiconductor memory deviceTOSHIBA KK·Filed 2010·Application pending·0 cites
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