Inventor · disambiguated record
Jooheon Kang
Also filed as: KANG JOOHEON
6 granted patents·4 pending applications·0 citations·filing 2020–2023
64Inventor score
Files withSAMSUNG ELECTRONICS CO LTD10
Top patents by PatentIndex Score
10 records- 0170US12477748B2Variable resistance memory device and electronic device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 18, 2025·0 cites·20 claims
- 0263US11957071B2Vertical variable resistance memory devices and methods of operation in the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Apr 9, 2024·0 cites·15 claims
- 0361US11398598B2Vertical variable resistance memory devices and methods of operation in the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jul 26, 2022·0 cites·20 claims
- 0456US12426264B2Semiconductor devices and data storage systems including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Sep 23, 2025·0 cites·20 claims
- 0556US2024196763A1Variable resistance memory device and electronic apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0656US2024215250A1Memory devices including vertical stack structure, methods of manufacturing and operating the same, and electronic apparatuses including memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0754US2024172457A1Vertical memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0851US12457754B2Nonvolatile memory device and operating method of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 28, 2025·0 cites·20 claims
- 0950US12082423B2Semiconductor device including blocking pattern, electronic system, and method of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Sep 3, 2024·0 cites·20 claims
- 1047US2023269942A1Semiconductor device including bit line pad, method for manufacturing the same and electronic system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →